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A high-counting-rate readout system for X-ray applications

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dc.contributor.author Zervakis, E en
dc.contributor.author Papananos, Y en
dc.contributor.author Loukas, D en
dc.contributor.author Haralabidis, N en
dc.contributor.author Pavlidis, A en
dc.date.accessioned 2014-03-01T02:42:23Z
dc.date.available 2014-03-01T02:42:23Z
dc.date.issued 2004 en
dc.identifier.issn 0018-9499 en
dc.identifier.uri http://hdl.handle.net/123456789/30982
dc.subject Author en
dc.subject Please supply your own keywords or send a blank e-mail to keywords@ieee.org to receive a list of suggested keywords en
dc.subject.classification Engineering, Electrical & Electronic en
dc.subject.classification Nuclear Science & Technology en
dc.subject.other Photodiode arrays en
dc.subject.other Photon transmission en
dc.subject.other Solid state sensors en
dc.subject.other Transimpedance amplifiers en
dc.subject.other Data acquisition en
dc.subject.other Image processing en
dc.subject.other Large scale systems en
dc.subject.other Photodiodes en
dc.subject.other Photons en
dc.subject.other Spurious signal noise en
dc.subject.other X rays en
dc.subject.other Application specific integrated circuits en
dc.title A high-counting-rate readout system for X-ray applications en
heal.type conferenceItem en
heal.identifier.primary 10.1109/TNS.2004.832646 en
heal.identifier.secondary http://dx.doi.org/10.1109/TNS.2004.832646 en
heal.language English en
heal.publicationDate 2004 en
heal.abstract A data acquisition system for processing signals produced by direct photon conversion sensors, primarily for applications in digital X-ray imaging, has been developed. The system comprises a custom-made PCI card, a front-end readout ASIC, and a digital counting ASIC. The operation of the readout ASIC is optimized for input capacitance of 2 pF per strip, which includes both the detector and the interconnection capacitance. The dynamic range of the system is extended from 30 up to 250 keV. Since the readout chip also includes a polarity select circuit, the system is suitable for applications with electron or hole collecting detectors. Due to the adopted readout architecture the counting rate achieved is extremely high, up to 3 MHz, while the measured noise was around 1200 electrons for 2 pF detector capacitance. The real-time imaging system is under evaluation in combination with CdTe detectors as front-end of a luggage inspection system. In this paper, the architecture and the performance of the two ASICs of the system are presented. en
heal.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC en
heal.journalName IEEE Transactions on Nuclear Science en
dc.identifier.doi 10.1109/TNS.2004.832646 en
dc.identifier.isi ISI:000223391600091 en
dc.identifier.volume 51 en
dc.identifier.issue 4 I en
dc.identifier.spage 1840 en
dc.identifier.epage 1847 en


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