Field screening by amorphous carbon thin films

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dc.contributor.author Xanthakis, JP en
dc.contributor.author Forbes, RG en
dc.date.accessioned 2014-03-01T02:43:20Z
dc.date.available 2014-03-01T02:43:20Z
dc.date.issued 2005 en
dc.identifier.uri http://hdl.handle.net/123456789/31339
dc.subject Amorphous Carbon en
dc.subject Charge Distribution en
dc.subject Thin Film en
dc.title Field screening by amorphous carbon thin films en
heal.type conferenceItem en
heal.identifier.primary 10.1109/IVNC.2005.1619508 en
heal.identifier.secondary http://dx.doi.org/10.1109/IVNC.2005.1619508 en
heal.identifier.secondary 1619508 en
heal.publicationDate 2005 en
heal.abstract We argue that the granularity of the screening charge distribution at or in the film surface may dominate the physics of field penetration into hopping conductors (including a-c:H films) and that a re-think of all related modelling looks necessary. en
heal.journalName Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005 en
dc.identifier.doi 10.1109/IVNC.2005.1619508 en
dc.identifier.volume 2005 en
dc.identifier.spage 107 en
dc.identifier.epage 108 en

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