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Electrostatic effects on the quality of gyrotron beams

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dc.contributor.author Vomvoridis, JL en
dc.contributor.author Hizanidis, K en
dc.contributor.author Tigelis, IG en
dc.contributor.author Frantzeskakis, DI en
dc.date.accessioned 2014-03-01T02:48:11Z
dc.date.available 2014-03-01T02:48:11Z
dc.date.issued 1993 en
dc.identifier.issn 0277786X en
dc.identifier.uri http://hdl.handle.net/123456789/33611
dc.relation.uri http://www.scopus.com/inward/record.url?eid=2-s2.0-0027808019&partnerID=40&md5=2c94fd7a43dc5bbb00bfc80b9b70a974 en
dc.subject.other Approximation theory en
dc.subject.other Beam plasma interactions en
dc.subject.other Computer simulation en
dc.subject.other Curve fitting en
dc.subject.other Cyclotrons en
dc.subject.other Electrostatics en
dc.subject.other Error analysis en
dc.subject.other Gyrotrons en
dc.subject.other Magnetostatics en
dc.subject.other Mathematical models en
dc.subject.other Plasma waves en
dc.subject.other Velocity en
dc.subject.other Electron trajectory en
dc.subject.other Electrostatic waves en
dc.subject.other Langmuir waves en
dc.subject.other Magnetostatic field en
dc.subject.other Electron beams en
dc.title Electrostatic effects on the quality of gyrotron beams en
heal.type conferenceItem en
heal.publicationDate 1993 en
heal.abstract An explanation for the discrepancy between the calculated and measured performance of gyrotrons lies in the possible development of electrostatic waves in the electron beam before it enters the gyrotron cavity. The authors report on the case of Langmuir waves, which may develop by their coupling to slow TM modes supported by the beam channel. Both the cases of quasi-uniform and of nonuniform guide magnetostatic field have been addressed analytically. In addition, computer simulations have been prepared, in which the trajectories of fast electrons are followed in the fields of slow TM waves in the beam channel. en
heal.publisher Publ by Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States en
heal.journalName Proceedings of SPIE - The International Society for Optical Engineering en
dc.identifier.volume 2104 en
dc.identifier.spage 460 en
dc.identifier.epage 461 en


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