Propagating variability from technology to system level

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dc.contributor.author Dierickx, B en
dc.contributor.author Miranda, M en
dc.contributor.author Dobrovolny, P en
dc.contributor.author Kutscherauer, F en
dc.contributor.author Papanikolaou, A en
dc.contributor.author Marchal, P en
dc.date.accessioned 2014-03-01T02:50:59Z
dc.date.available 2014-03-01T02:50:59Z
dc.date.issued 2007 en
dc.identifier.uri http://hdl.handle.net/123456789/35271
dc.subject Design Flow en
dc.subject Monte Carlo en
dc.subject Monte Carlo Technique en
dc.subject Rare Event en
dc.title Propagating variability from technology to system level en
heal.type conferenceItem en
heal.identifier.primary 10.1109/IWPSD.2007.4472457 en
heal.identifier.secondary http://dx.doi.org/10.1109/IWPSD.2007.4472457 en
heal.publicationDate 2007 en
heal.abstract As CMOS technology feature sizes decrease, variability more and more jeopardizes system level parametric and functional yield. This paper proposes a framework that can capture variability at all levels in the design flow. It offers a correlated view on yield, timing, dynamic and static energy. Preservation on rare events in variability distributions is obtained by the Weighted Monte Carlo technique. en
heal.journalName International Workshop on Physics of Semiconductor Devices en
dc.identifier.doi 10.1109/IWPSD.2007.4472457 en

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