Robust discretization algorithms for the numerical intergration of nonlinear PDEs with application to a generalized capacitor

Koumboulis, FN; Skarpetis, MG; Mertzios, BG

dc.contributor.author	Koumboulis, FN	en
dc.contributor.author	Skarpetis, MG	en
dc.contributor.author	Mertzios, BG	en
dc.date.accessioned	2014-03-01T01:47:26Z
dc.date.available	2014-03-01T01:47:26Z
dc.date.issued	1998	en
dc.identifier.issn	09633308	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/25214
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-2742592598&partnerID=40&md5=e3f77a5ec6639a13f98b17c5686299b1	en
dc.subject.other	Algorithms	en
dc.subject.other	Approximation theory	en
dc.subject.other	Capacitance	en
dc.subject.other	Capacitors	en
dc.subject.other	Dielectric materials	en
dc.subject.other	Digital filters	en
dc.subject.other	Electric conductors	en
dc.subject.other	Electric resistance	en
dc.subject.other	Integration	en
dc.subject.other	Maxwell equations	en
dc.subject.other	Nonlinear equations	en
dc.subject.other	Continuous domain physical systems	en
dc.subject.other	Multidimensional systems	en
dc.subject.other	Control system analysis	en
dc.title	Robust discretization algorithms for the numerical intergration of nonlinear PDEs with application to a generalized capacitor	en
heal.type	journalArticle	en
heal.publicationDate	1998	en
heal.abstract	Numerical integration of nonlinear (NL) partial differential equations (PDEs) is studied via approximating the original continuous-domain physical system by a discrete multidimensional (MD) and passive system, using principles of wave digital filters. Resulting integration algorithms are highly robust, massively parallel, imply only local interconnections. The numerically integrated system of NL PDEs is a special case of the Maxwell's equations, namely the system of two conductor plates separated by dielectric. Inductance, capacitance and resistance coefficients are appropriate nonlinear functions of the currents, voltage, space and time.	en
heal.journalName	IEE Colloquium (Digest)	en
dc.identifier.issue	225	en
dc.identifier.spage	2/1	en
dc.identifier.epage	2/6	en