Effects of Device Aging on Microelectronics Radiation Response and Reliability

Fleetwood, D; Rodgers, M; Tsetseris, L; Zhou, X; Batyrev, I; Wang, S; Schrimpf, R; Pantelides, S

URI: https://dspace.lib.ntua.gr/xmlui/handle/123456789/34993

Date: 2006

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