Berthelon, L; Audouin, O; Bonno, P; Drion, C; Grard, E; Rofidal, O; Martin, CM; Ringoot, E; Van de Voorde, I; Eilenberger, GJ; Raeymaekers, F; Chauvin, J; Hoa, DHB; Morin, M; Qiu, XZ; Vandewege, J; Daeleman, T; Angelopoulos, J; Taille, C
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2000)
