dc.contributor.author |
Panagopoulos, CN |
en |
dc.date.accessioned |
2014-03-01T01:07:30Z |
|
dc.date.available |
2014-03-01T01:07:30Z |
|
dc.date.issued |
1989 |
en |
dc.identifier.issn |
0254-0584 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/10036 |
|
dc.relation.uri |
http://www.scopus.com/inward/record.url?eid=2-s2.0-0024900322&partnerID=40&md5=4c09d95772dd826b9bb86f885c11d657 |
en |
dc.subject.classification |
Materials Science, Multidisciplinary |
en |
dc.subject.other |
Oxides--Stresses |
en |
dc.subject.other |
Stresses--Analysis |
en |
dc.subject.other |
Internal Stress |
en |
dc.subject.other |
Potentiostatic Anodization |
en |
dc.subject.other |
Tungsten Oxides |
en |
dc.subject.other |
Valve Metals |
en |
dc.subject.other |
Tungsten and Alloys |
en |
dc.title |
Internal stress in growing wo3 films |
en |
heal.type |
journalArticle |
en |
heal.language |
English |
en |
heal.publicationDate |
1989 |
en |
heal.abstract |
During the potentiostatic anodization of tungsten,the anodic and open-circuit stress were studied. The anodic stress was observed to be compressive whereas the open-circuit stress was found to be tensile in the anodic tungsten oxide. The anodic stress was found to decrease and the open-circuit stress to increase with increasing thickness of growing tungsten oxide. © 1989. |
en |
heal.publisher |
ELSEVIER SCIENCE SA LAUSANNE |
en |
heal.journalName |
Materials Chemistry and Physics |
en |
dc.identifier.isi |
ISI:A1989CC16600008 |
en |
dc.identifier.volume |
24 |
en |
dc.identifier.issue |
1-2 |
en |
dc.identifier.spage |
89 |
en |
dc.identifier.epage |
97 |
en |