Characteristics of doubling circuits used in gas laser excitation: Application to the N2 laser

Papadopoulos Abraham, D; Serafetinides Alexander, A

dc.contributor.author	Papadopoulos Abraham, D	en
dc.contributor.author	Serafetinides Alexander, A	en
dc.date.accessioned	2014-03-01T01:07:49Z
dc.date.available	2014-03-01T01:07:49Z
dc.date.issued	1990	en
dc.identifier.issn	0018-9197	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/10192
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.classification	Physics, Applied	en
dc.subject.other	Lasers, Excimer	en
dc.subject.other	Nitrogen	en
dc.subject.other	Doubling Circuits	en
dc.subject.other	Gas Laser Excitation	en
dc.subject.other	Nitrogen Lasers	en
dc.subject.other	Lasers, Gas	en
dc.title	Characteristics of doubling circuits used in gas laser excitation: Application to the N2 laser	en
heal.type	journalArticle	en
heal.identifier.primary	10.1109/3.44931	en
heal.identifier.secondary	http://dx.doi.org/10.1109/3.44931	en
heal.language	English	en
heal.publicationDate	1990	en
heal.abstract	The electrical characteristics of a doubling circuit (or LC-inversion circuit) used to excite a TEA (transversely excited atmospheric) N2 laser have been studied, and a theoretical model for the voltage and current oscillations in the circuit is proposed. The theoretical predictions are in excellent agreement with the experimental data, and thus the shape of the voltage and current waveforms in doubling circuits can be predicted from the circuit parameters. With this method, the nonmeasurable quantities of inductance and resistance of the laser gas discharge and their dependence on the electrode gap can be determined. The theoretical treatment described can be easily applied to any type of gas using doubling-circuit excitation, such as excimer lasers.	en
heal.publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC	en
heal.journalName	IEEE Journal of Quantum Electronics	en
dc.identifier.doi	10.1109/3.44931	en
dc.identifier.isi	ISI:A1990CM10500023	en
dc.identifier.volume	26	en
dc.identifier.issue	1	en
dc.identifier.spage	177	en
dc.identifier.epage	188	en