Millimeter wavelength radiation emission during dielectric aging

Dervos, C; Bourkas, PD; Kagarakis, CA; Uzunoglu, NK

dc.contributor.author	Dervos, C	en
dc.contributor.author	Bourkas, PD	en
dc.contributor.author	Kagarakis, CA	en
dc.contributor.author	Uzunoglu, NK	en
dc.date.accessioned	2014-03-01T01:08:01Z
dc.date.available	2014-03-01T01:08:01Z
dc.date.issued	1990	en
dc.identifier.issn	0195-9271	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/10249
dc.subject	current-voltage characteristic	en
dc.subject	High Voltage	en
dc.subject	Oscillations	en
dc.subject	Negative Differential Conductance	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.classification	Optics	en
dc.subject.classification	Physics, Applied	en
dc.subject.other	Dielectric Materials - Aging	en
dc.subject.other	Electric Conductivity - Measurements	en
dc.subject.other	Millimeter Waves	en
dc.subject.other	Current-Voltage Characteristic	en
dc.subject.other	Dielectric Aging	en
dc.subject.other	Negative Differential Conductance	en
dc.subject.other	Radiation Emission	en
dc.subject.other	Self-Sustained Conductivity Oscillations	en
dc.subject.other	Solid State Devices, Mim	en
dc.title	Millimeter wavelength radiation emission during dielectric aging	en
heal.type	journalArticle	en
heal.identifier.primary	10.1007/BF01010520	en
heal.identifier.secondary	http://dx.doi.org/10.1007/BF01010520	en
heal.language	English	en
heal.publicationDate	1990	en
heal.abstract	The current-voltage characteristic for a ""metal - thick insulator - metal"" structure has been investigated by applying high voltage impulses on a variety of industrial insulators. It appears that, in the high field regime (∼1MV/cm) S-type Negative Differential Conductance may occur, leading to self sustained conductivity oscillations possibly originating in field dependent carrier mobility. The phenomenon is associated with radiation emission during thermalization of hot electrons. Measurements have established the presence of millimeter wavelength radiation during prebreakdown and breakdown stages. The radiation emission intervals within a high-voltage pulse application and response have also been investigated. © 1990 Plenum Publishing Corporation.	en
heal.publisher	Kluwer Academic Publishers-Plenum Publishers	en
heal.journalName	International Journal of Infrared and Millimeter Waves	en
dc.identifier.doi	10.1007/BF01010520	en
dc.identifier.isi	ISI:A1990CT19200014	en
dc.identifier.volume	11	en
dc.identifier.issue	2	en
dc.identifier.spage	275	en
dc.identifier.epage	288	en