Analysis and VLSI architecture of a nonlinear edge-preserving noise-smoothing image filter

Papananos, Y; Anastassiou, D

dc.contributor.author	Papananos, Y	en
dc.contributor.author	Anastassiou, D	en
dc.date.accessioned	2014-03-01T01:08:14Z
dc.date.available	2014-03-01T01:08:14Z
dc.date.issued	1991	en
dc.identifier.issn	0956-3768	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/10366
dc.subject	IMAGE PROCESSING	en
dc.subject	NOISE SMOOTHING	en
dc.subject	EDGE PRESERVING	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.other	Image Processing	en
dc.subject.other	Integrated Circuits, CMOS	en
dc.subject.other	Integrated Circuits, VLSI	en
dc.subject.other	Probability--Random Processes	en
dc.subject.other	Statistical Methods	en
dc.subject.other	2-D filters	en
dc.subject.other	Image filters	en
dc.subject.other	Markov models	en
dc.subject.other	Noise smoothing	en
dc.subject.other	Stochastic models	en
dc.subject.other	VLSI architecture	en
dc.subject.other	Optical Filters	en
dc.title	Analysis and VLSI architecture of a nonlinear edge-preserving noise-smoothing image filter	en
heal.type	journalArticle	en
heal.identifier.primary	10.1049/ip-g-2.1991.0075	en
heal.identifier.secondary	http://dx.doi.org/10.1049/ip-g-2.1991.0075	en
heal.language	English	en
heal.publicationDate	1991	en
heal.abstract	A nonlinear, nonrecursive, two-dimensional filter for edge preserving and noise smoothing of images is developed. The filter is applied over a 3 x 3 window of pixels and uses a thresholding operation. It is tested against other filters of the same class and its efficiency is proven by simulation. Analytical evaluation is also performed using a first-order stochastic Markov model. The computational requirements lead to the use of special purpose hardware for real-time implementation. A massively parallel array structure is proposed and the basic processing element realising the filtering operation is implemented in CMOS VLSI using minimal hardware components.	en
heal.publisher	IEE-INST ELEC ENG	en
heal.journalName	IEE Proceedings, Part G: Circuits, Devices and Systems	en
dc.identifier.doi	10.1049/ip-g-2.1991.0075	en
dc.identifier.isi	ISI:A1991FZ75700001	en
dc.identifier.volume	138	en
dc.identifier.issue	4	en
dc.identifier.spage	433	en
dc.identifier.epage	440	en