Charge transport trough a ""metal-thick insulator-metal"" structure during impulse voltage excitation

Dervos, C; Bourkas, PD; Kagarakis, CA

dc.contributor.author	Dervos, C	en
dc.contributor.author	Bourkas, PD	en
dc.contributor.author	Kagarakis, CA	en
dc.date.accessioned	2014-03-01T01:08:16Z
dc.date.available	2014-03-01T01:08:16Z
dc.date.issued	1991	en
dc.identifier.issn	0304-3886	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/10388
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-0026208035&partnerID=40&md5=5d29c1754c016ef244f97591bbb57df4	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.other	Electrooptical Devices	en
dc.subject.other	Ionization	en
dc.subject.other	Mathematical Techniques--Applications	en
dc.subject.other	Organic Compounds	en
dc.subject.other	Current-Voltage Characteristics	en
dc.subject.other	Negative Differential Resistance	en
dc.subject.other	Solid State Devices, MIM	en
dc.title	Charge transport trough a ""metal-thick insulator-metal"" structure during impulse voltage excitation	en
heal.type	journalArticle	en
heal.language	English	en
heal.publicationDate	1991	en
heal.abstract	The current-voltage characteristic for a ""metal-thick insulator-metal"" structure has been investigated using high-voltage pulse excitation. Charge electro-optic mapping has shown a filamentary current distribution, which is in good agreement with the arguments for S-type Negative Differential Resistance during the prebreakdown stages of organic insulators. Based on the experimental data and the obtained I - V curve for the examined MIM structure, a first-order nonlinear equivalent circuit is proposed and its stability criteria are discussed. It appears that impact ionization phenomena are associated with current instabilities between stable and unstable operating points of the equivalent circuit. © 1991.	en
heal.publisher	ELSEVIER SCIENCE BV	en
heal.journalName	Journal of Electrostatics	en
dc.identifier.isi	ISI:A1991GJ26400003	en
dc.identifier.volume	26	en
dc.identifier.issue	2	en
dc.identifier.spage	121	en
dc.identifier.epage	132	en