dc.contributor.author |
Anastassakis, E |
en |
dc.date.accessioned |
2014-03-01T01:09:04Z |
|
dc.date.available |
2014-03-01T01:09:04Z |
|
dc.date.issued |
1992 |
en |
dc.identifier.issn |
0038-1098 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/10820 |
|
dc.relation.uri |
http://www.scopus.com/inward/record.url?eid=2-s2.0-0026940962&partnerID=40&md5=bc51702d3062e900401c961c1e4f544f |
en |
dc.subject.classification |
Physics, Condensed Matter |
en |
dc.subject.other |
Phonons |
en |
dc.subject.other |
Piezoelectricity |
en |
dc.subject.other |
Raman scattering |
en |
dc.subject.other |
Strain |
en |
dc.subject.other |
Phonon deformation potentials |
en |
dc.subject.other |
Phonon frequency shifts |
en |
dc.subject.other |
Piezoelectric fields |
en |
dc.subject.other |
Heterojunctions |
en |
dc.title |
Strain and piezoelectric effects on the phonon frequencies in heterostructures |
en |
heal.type |
journalArticle |
en |
heal.language |
English |
en |
heal.publicationDate |
1992 |
en |
heal.abstract |
It is shown that the strain characterization of heterostructures based on phonon frequency shifts is modified when piezoelectric fields are present. The well-known phenomenological theory and Raman practice for obtaining the strain phonon deformation potentials, i.e., parameters connecting frequency shifts with strains, are extended to include electric-field phonon deformation potentials. Both sets of deformation potentials can be obtained from combined Raman experiments under hydrostatic pressure, performed on strained layers grown along [001], [110], and [111]. Expressions are given for the frequency shifts in terms of the deformation potentials, for all scattering configurations allowed by selection rules. © 1992. |
en |
heal.publisher |
PERGAMON-ELSEVIER SCIENCE LTD |
en |
heal.journalName |
Solid State Communications |
en |
dc.identifier.isi |
ISI:A1992JT05900012 |
en |
dc.identifier.volume |
84 |
en |
dc.identifier.issue |
1-2 |
en |
dc.identifier.spage |
47 |
en |
dc.identifier.epage |
50 |
en |