APPLICATION OF THE RESONANCE TECHNIQUE FOR THE EVALUATION OF TE AND TM MODES GUIDED BY SUCCESSIVE NON-KERR NONLINEAR DIELECTRIC PLANAR LAYER STRUCTURES

KANELLOPOULOS, JD; STATHOPOULOS, NA

dc.contributor.author	KANELLOPOULOS, JD	en
dc.contributor.author	STATHOPOULOS, NA	en
dc.date.accessioned	2014-03-01T01:09:18Z
dc.date.available	2014-03-01T01:09:18Z
dc.date.issued	1993	en
dc.identifier.issn	0950-0340	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/10887
dc.subject	Layered Structure	en
dc.subject.classification	Optics	en
dc.subject.other	WAVE-GUIDES	en
dc.subject.other	THIN-FILMS	en
dc.subject.other	SLAB	en
dc.subject.other	INDEX	en
dc.subject.other	MEDIA	en
dc.title	APPLICATION OF THE RESONANCE TECHNIQUE FOR THE EVALUATION OF TE AND TM MODES GUIDED BY SUCCESSIVE NON-KERR NONLINEAR DIELECTRIC PLANAR LAYER STRUCTURES	en
heal.type	journalArticle	en
heal.identifier.primary	10.1080/09500349314550791	en
heal.identifier.secondary	http://dx.doi.org/10.1080/09500349314550791	en
heal.language	English	en
heal.publicationDate	1993	en
heal.abstract	A simple and easily programmable method based on the resonance technique has been developed for analysing successive optical nonlinear layers bounded by linear media. We consider here nonlinear media of the general type (non-Kerr media) including the more complicated but realistic case of saturable media. In this formulation both TE and TM polarization are examined. In the present paper as an example of the proposed methodology, the five layers waveguiding configuration, including three nonlinear planar layers bounded by linear cladding and substrate media is treated. The results obtained by this method include both field distribution and power calculations	en
heal.publisher	TAYLOR & FRANCIS LTD	en
heal.journalName	JOURNAL OF MODERN OPTICS	en
dc.identifier.doi	10.1080/09500349314550791	en
dc.identifier.isi	ISI:A1993LG39900001	en
dc.identifier.volume	40	en
dc.identifier.issue	5	en
dc.identifier.spage	743	en
dc.identifier.epage	760	en