APPROACH TO PARTIAL DISCHARGE DEVELOPMENT IN CLOSELY COUPLED CAVITIES EMBEDDED IN SOLID DIELECTRICS BY THE LUMPED CAPACITANCE MODEL

AGORIS, DP; HATZIARGYRIOU, ND

dc.contributor.author	AGORIS, DP	en
dc.contributor.author	HATZIARGYRIOU, ND	en
dc.date.accessioned	2014-03-01T01:09:18Z
dc.date.available	2014-03-01T01:09:18Z
dc.date.issued	1993	en
dc.identifier.issn	0143-702X	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/10889
dc.subject	GAS DISCHARGES	en
dc.subject	SOLID DIELECTRICS	en
dc.subject	CLOSELY-COUPED CAVITIES	en
dc.subject	LUMPED CAPACITANCE MODEL	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.title	APPROACH TO PARTIAL DISCHARGE DEVELOPMENT IN CLOSELY COUPLED CAVITIES EMBEDDED IN SOLID DIELECTRICS BY THE LUMPED CAPACITANCE MODEL	en
heal.type	journalArticle	en
heal.identifier.primary	10.1049/ip-a-3.1993.0021	en
heal.identifier.secondary	http://dx.doi.org/10.1049/ip-a-3.1993.0021	en
heal.language	English	en
heal.publicationDate	1993	en
heal.abstract	The use of the typical ABC equivalent circuit for one cavity in solid dielectrics for internal partial discharge modelling has been common practice for many years. The introduction of an equivalent circuit for two closely coupled cavities permits the investigation of the interaction between discharges in such cavities in a solid dielectric when it is stressed by high AC voltages. In this model circuit, cavities and solid dielectric parts are represented as lumped capacitances, while the resistance and the inductance of the test voltage source are taken into consideration. By using a version of the Electromagnetic Transients Program (EMTP), the waveforms of the voltage across the two cavities, as well as those of the voltage across the neighbouring parts of the solid dielectric, have been traced, and the transient voltage stressing of these parts has been analysed for repetitive discharges in the two cavities.	en
heal.publisher	IEE-INST ELEC ENG	en
heal.journalName	IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY	en
dc.identifier.doi	10.1049/ip-a-3.1993.0021	en
dc.identifier.isi	ISI:A1993LW31800004	en
dc.identifier.volume	140	en
dc.identifier.issue	2	en
dc.identifier.spage	131	en
dc.identifier.epage	134	en