Bifurcation evolution across metal-metal contact sustaining high charge injection rates

Dervos, CT; Fitsilis, PT

dc.contributor.author	Dervos, CT	en
dc.contributor.author	Fitsilis, PT	en
dc.date.accessioned	2014-03-01T01:09:44Z
dc.date.available	2014-03-01T01:09:44Z
dc.date.issued	1994	en
dc.identifier.issn	1070-9886	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/11169
dc.subject	Charge Injection	en
dc.subject	Dynamic System	en
dc.subject	Equivalent Circuit	en
dc.subject	Negative Differential Resistance	en
dc.subject	Phase Space	en
dc.subject.classification	Engineering, Manufacturing	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.classification	Materials Science, Multidisciplinary	en
dc.subject.other	Chaos theory	en
dc.subject.other	Electric connectors	en
dc.subject.other	Equivalent circuits	en
dc.subject.other	Interfaces (materials)	en
dc.subject.other	Bifurcation evolution	en
dc.subject.other	Change injection	en
dc.subject.other	Metal-metal contacts	en
dc.subject.other	Electric contacts	en
dc.title	Bifurcation evolution across metal-metal contact sustaining high charge injection rates	en
heal.type	journalArticle	en
heal.identifier.primary	10.1109/95.296412	en
heal.identifier.secondary	http://dx.doi.org/10.1109/95.296412	en
heal.language	English	en
heal.publicationDate	1994	en
heal.abstract	In real world even the simplest of the electrical components may exhibit unpredictable characteristics, and it seems that the theory of chaos touches all disciplines. In this work, the contact potential instabilities induced by the high electronic injection rates between metal-to-metal contacts are experimentally investigated in an I-V phase space using state-of-the-art data logging systems. The mechanically contacted metals are energized by a sinusoidal power source, and their response is systematically studied within a 50-Hz cycle. The obtained results convincingly demonstrate their chaotic nature. Two entirely different instability types have been observed for such systems. Their classification may lead to a better understanding of negative differential resistance (NDR) formation, which is frequently observed across highly injecting interfaces. An equivalent circuit for the examined dynamic system is provided, and an effective test for the industrial no-load switching contacts is proposed.	en
heal.publisher	Publ by IEEE, Piscataway, NJ, United States	en
heal.journalName	IEEE transactions on components, packaging, and manufacturing technology. Part A	en
dc.identifier.doi	10.1109/95.296412	en
dc.identifier.isi	ISI:A1994NZ21800016	en
dc.identifier.volume	17	en
dc.identifier.issue	2	en
dc.identifier.spage	286	en
dc.identifier.epage	294	en