Preparation and characterization of electrophoretically deposited high-temperature superconductor coatings

Ochsenkuhn-Petropulu, M; Tarantilis, P; Parissakis, G; Psycharis, V; Moraitakis, E; Niarchos, D

dc.contributor.author	Ochsenkuhn-Petropulu, M	en
dc.contributor.author	Tarantilis, P	en
dc.contributor.author	Parissakis, G	en
dc.contributor.author	Psycharis, V	en
dc.contributor.author	Moraitakis, E	en
dc.contributor.author	Niarchos, D	en
dc.date.accessioned	2014-03-01T01:10:09Z
dc.date.available	2014-03-01T01:10:09Z
dc.date.issued	1994	en
dc.identifier.issn	0026-3672	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/11325
dc.subject	electrophoretic coatings	en
dc.subject	EPMA	en
dc.subject	high-temperature superconductors	en
dc.subject	SEM	en
dc.subject	SQUID	en
dc.subject	XRD	en
dc.subject.classification	Chemistry, Analytical	en
dc.subject.other	POWDER DIFFRACTION PATTERNS	en
dc.subject.other	FILMS	en
dc.subject.other	FABRICATION	en
dc.title	Preparation and characterization of electrophoretically deposited high-temperature superconductor coatings	en
heal.type	journalArticle	en
heal.identifier.primary	10.1007/BF01243133	en
heal.identifier.secondary	http://dx.doi.org/10.1007/BF01243133	en
heal.language	English	en
heal.publicationDate	1994	en
heal.abstract	The high-temperature superconductor, YBa2Cu3O7-x (x = 0.1-0.2) [YBCO], was prepared using an optimized calcination and sintering process. Thin layers of a few microns of this material were deposited on a silver substrate by applying a simplified electrophoretic deposition technique in a suspension of the fine, < 10 μm, superconductor powder in a non-aqueous liquid. To get a uniform and strongly adherent coating, the deposition process is repeated several times, followed by an appropriate sintering procedure. The initially prepared YBCO powder and the coatings produced were characterized for their superconducting properties by X-ray diffraction analysis (XRD), magnetization measurements with a Superconducting Quantum Interference Device (SQUID) and electrical resistivity measurements. By scanning electron microscopy (SEM) and electron probe microanalysis (EPMA) the grain size of the YBCO film, its thickness and impurity content, respectively, were estimated. © 1994 Springer-Verlag.	en
heal.publisher	Springer-Verlag	en
heal.journalName	Mikrochimica Acta	en
dc.identifier.doi	10.1007/BF01243133	en
dc.identifier.isi	ISI:A1994NM12100003	en
dc.identifier.volume	113	en
dc.identifier.issue	1-2	en
dc.identifier.spage	19	en
dc.identifier.epage	27	en