General results for resistive noise in active RC and MOSFET-C filters

Toth, L; Efthivoulidis, G; Gopinathan, V; Tsividis, YP

dc.contributor.author	Toth, L	en
dc.contributor.author	Efthivoulidis, G	en
dc.contributor.author	Gopinathan, V	en
dc.contributor.author	Tsividis, YP	en
dc.date.accessioned	2014-03-01T01:11:03Z
dc.date.available	2014-03-01T01:11:03Z
dc.date.issued	1995	en
dc.identifier.issn	1057-7130	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/11541
dc.subject	Dynamic Range	en
dc.subject	Power Dissipation	en
dc.subject	Power Spectral Density	en
dc.subject	Transfer Function	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.other	CONTINUOUS-TIME FILTERS	en
dc.subject.other	BANDPASS-FILTERS	en
dc.subject.other	DYNAMIC-RANGE	en
dc.subject.other	DESIGN	en
dc.subject.other	CMOS	en
dc.subject.other	VLSI	en
dc.title	General results for resistive noise in active RC and MOSFET-C filters	en
heal.type	journalArticle	en
heal.identifier.primary	10.1109/82.476176	en
heal.identifier.secondary	http://dx.doi.org/10.1109/82.476176	en
heal.language	English	en
heal.publicationDate	1995	en
heal.abstract	Resistive noise in active RC and MOSFET-C filters is examined, The effects of impedance and frequency scaling are shown. The relationship between sensitivity and noise is considered. A bound for the product of resistive power dissipation and noise power spectral density is derived, Topology-independent and transfer function-independent bounds for the dynamic range, in filters with power dissipation constraint, are developed.	en
heal.publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC	en
heal.journalName	IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING	en
dc.identifier.doi	10.1109/82.476176	en
dc.identifier.isi	ISI:A1995TM71100004	en
dc.identifier.volume	42	en
dc.identifier.issue	12	en
dc.identifier.spage	785	en
dc.identifier.epage	793	en