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LIGHT-EMISSION FROM SILICON NANOSTRUCTURES PRODUCED BY CONVENTIONAL LITHOGRAPHIC AND REACTIVE ION ETCHING TECHNIQUES

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dc.contributor.author NASSIOPOULOS, AG en
dc.contributor.author GRIGOROPOULOS, S en
dc.contributor.author PAPADIMITRIOU, D en
dc.contributor.author GOGOLIDES, E en
dc.date.accessioned 2014-03-01T01:11:09Z
dc.date.available 2014-03-01T01:11:09Z
dc.date.issued 1995 en
dc.identifier.issn 0370-1972 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/11566
dc.subject Reactive Ion Etching en
dc.subject.classification Physics, Condensed Matter en
dc.subject.other FABRICATION en
dc.title LIGHT-EMISSION FROM SILICON NANOSTRUCTURES PRODUCED BY CONVENTIONAL LITHOGRAPHIC AND REACTIVE ION ETCHING TECHNIQUES en
heal.type journalArticle en
heal.identifier.primary 10.1002/pssb.2221900114 en
heal.identifier.secondary http://dx.doi.org/10.1002/pssb.2221900114 en
heal.language English en
heal.publicationDate 1995 en
heal.abstract Sub-ten nanometer diameter silicon pillars and silicon walls of the same thickness are Fabricated by using conventional optical lithography based on deep-UV exposure and reactive ion etching using fluorine only containing gases. The produced structures are studied for their luminescence properties. Visible photoluminescence with a peak in the range 580 to 650 nm is observed under Ar laser irradiation. en
heal.publisher AKADEMIE VERLAG GMBH en
heal.journalName PHYSICA STATUS SOLIDI B-BASIC RESEARCH en
dc.identifier.doi 10.1002/pssb.2221900114 en
dc.identifier.isi ISI:A1995RM43600013 en
dc.identifier.volume 190 en
dc.identifier.issue 1 en
dc.identifier.spage 91 en
dc.identifier.epage 95 en


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