dc.contributor.author |
NASSIOPOULOS, AG |
en |
dc.contributor.author |
GRIGOROPOULOS, S |
en |
dc.contributor.author |
PAPADIMITRIOU, D |
en |
dc.contributor.author |
GOGOLIDES, E |
en |
dc.date.accessioned |
2014-03-01T01:11:09Z |
|
dc.date.available |
2014-03-01T01:11:09Z |
|
dc.date.issued |
1995 |
en |
dc.identifier.issn |
0370-1972 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/11566 |
|
dc.subject |
Reactive Ion Etching |
en |
dc.subject.classification |
Physics, Condensed Matter |
en |
dc.subject.other |
FABRICATION |
en |
dc.title |
LIGHT-EMISSION FROM SILICON NANOSTRUCTURES PRODUCED BY CONVENTIONAL LITHOGRAPHIC AND REACTIVE ION ETCHING TECHNIQUES |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1002/pssb.2221900114 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1002/pssb.2221900114 |
en |
heal.language |
English |
en |
heal.publicationDate |
1995 |
en |
heal.abstract |
Sub-ten nanometer diameter silicon pillars and silicon walls of the same thickness are Fabricated by using conventional optical lithography based on deep-UV exposure and reactive ion etching using fluorine only containing gases. The produced structures are studied for their luminescence properties. Visible photoluminescence with a peak in the range 580 to 650 nm is observed under Ar laser irradiation. |
en |
heal.publisher |
AKADEMIE VERLAG GMBH |
en |
heal.journalName |
PHYSICA STATUS SOLIDI B-BASIC RESEARCH |
en |
dc.identifier.doi |
10.1002/pssb.2221900114 |
en |
dc.identifier.isi |
ISI:A1995RM43600013 |
en |
dc.identifier.volume |
190 |
en |
dc.identifier.issue |
1 |
en |
dc.identifier.spage |
91 |
en |
dc.identifier.epage |
95 |
en |