dc.contributor.author |
Ladas, KT |
en |
dc.contributor.author |
Maniatis, TA |
en |
dc.contributor.author |
Uzunoglu, NK |
en |
dc.date.accessioned |
2014-03-01T01:12:09Z |
|
dc.date.available |
2014-03-01T01:12:09Z |
|
dc.date.issued |
1996 |
en |
dc.identifier.issn |
0272-6343 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/11979 |
|
dc.subject |
Field Data |
en |
dc.subject.classification |
Engineering, Electrical & Electronic |
en |
dc.subject.other |
Algorithms |
en |
dc.subject.other |
Dielectric materials |
en |
dc.subject.other |
Electromagnetic fields |
en |
dc.subject.other |
Image reconstruction |
en |
dc.subject.other |
Iterative methods |
en |
dc.subject.other |
Numerical methods |
en |
dc.subject.other |
Refractive index |
en |
dc.subject.other |
Heitler equation |
en |
dc.subject.other |
Incident wavefield |
en |
dc.subject.other |
Scattered field data |
en |
dc.subject.other |
Scattering potential |
en |
dc.subject.other |
Wavelength |
en |
dc.subject.other |
Electromagnetic wave scattering |
en |
dc.title |
On the reconstruction of dielectric objects from scattered field data using the heitler equation |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1080/02726349608908456 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1080/02726349608908456 |
en |
heal.language |
English |
en |
heal.publicationDate |
1996 |
en |
heal.abstract |
The problem of determining a scattering potential from scattered field data, is addressed within the Heitler equation. This equation relates the on shell components of the T matrix directly to the scattering: potential. This relationship leads to a novel iterative reconstruction algorithm for recovering the distribution of the possibly complex index of refraction of the scattering potential from measurements of the scattered field outside the potential at a single frequency. Reconstructions of cylindrical objects from data obtained in a suite of scattering experiments show that the method can handle relatively large objects compared to the wavelength whose index of refraction is close to the index of refraction of the surrounding medium. |
en |
heal.publisher |
HEMISPHERE PUBL CORP |
en |
heal.journalName |
Electromagnetics |
en |
dc.identifier.doi |
10.1080/02726349608908456 |
en |
dc.identifier.isi |
ISI:A1996TW71200002 |
en |
dc.identifier.volume |
16 |
en |
dc.identifier.issue |
1 |
en |
dc.identifier.spage |
17 |
en |
dc.identifier.epage |
34 |
en |