An analytical statistical model for the RMS delay spread parameter in millimeter frequencies

Dimitrakopoulos, GA; Capsalis, CN

dc.contributor.author	Dimitrakopoulos, GA	en
dc.contributor.author	Capsalis, CN	en
dc.date.accessioned	2014-03-01T01:12:36Z
dc.date.available	2014-03-01T01:12:36Z
dc.date.issued	1997	en
dc.identifier.issn	0195-9271	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/12165
dc.subject	Degree of Freedom	en
dc.subject	Digital Systems	en
dc.subject	intersymbol interference	en
dc.subject	Path Following	en
dc.subject	Propagation Delay	en
dc.subject	Rms Delay Spread	en
dc.subject	Standard Deviation	en
dc.subject	Statistical Model	en
dc.subject	System Engineering	en
dc.subject	Uniform Distribution	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.classification	Optics	en
dc.subject.classification	Physics, Applied	en
dc.subject.other	Calculations	en
dc.subject.other	Mathematical models	en
dc.subject.other	Millimeter waves	en
dc.subject.other	Statistical methods	en
dc.subject.other	Statistics	en
dc.subject.other	Wireless high bit-rate digital systems	en
dc.subject.other	X-square criterion	en
dc.subject.other	Electromagnetic wave propagation	en
dc.title	An analytical statistical model for the RMS delay spread parameter in millimeter frequencies	en
heal.type	journalArticle	en
heal.identifier.primary	10.1007/BF02678238	en
heal.identifier.secondary	http://dx.doi.org/10.1007/BF02678238	en
heal.language	English	en
heal.publicationDate	1997	en
heal.abstract	A new statistical model for rms delay spread is presented. The model has been developed under the assumption of the existence of two paths (two-path model). It is assumed that the amplitude of each path follows the so-called log-Student distribution with one degree of freedom, while the differential propagation delay of the two paths follows the uniform distribution. The parameters involved with the model are m(Z) and s(Z) the mean and standard deviation of the ratio of the two paths' amplitudes. Theoretical curves for tau(rms) as well as for the mean and standard deviation of tau(rms) are plotted for different values of m(Z) and s(Z). These curves are extremely useful for the choice of the parameters of the model for different cases. In order to examine the validity of the new model, measurements from the literature have been collected and compared with the theoretical results. In all cases a very good agreement, according to the X-square criterion, between theoretical and experimental curves has been observed. As a result, the new model can be used by system engineers for the development of wireless high bit-rate digital systems that will not suffer from intersymbol interference.	en
heal.publisher	PLENUM PUBL CORP	en
heal.journalName	International Journal of Infrared and Millimeter Waves	en
dc.identifier.doi	10.1007/BF02678238	en
dc.identifier.isi	ISI:A1997XF91700017	en
dc.identifier.volume	18	en
dc.identifier.issue	6	en
dc.identifier.spage	1335	en
dc.identifier.epage	1351	en