Influence of the thickness of a NixOy, support on the reflected wavelength from cholesteric liquid crystals

Koui, M; Karayannis, HS; Kartsonakis, M

dc.contributor.author	Koui, M	en
dc.contributor.author	Karayannis, HS	en
dc.contributor.author	Kartsonakis, M	en
dc.date.accessioned	2014-03-01T01:13:00Z
dc.date.available	2014-03-01T01:13:00Z
dc.date.issued	1997	en
dc.identifier.issn	0267-8292	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/12318
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-0001749349&partnerID=40&md5=6470cf389567de4e7eb741d1a5702e2a	en
dc.subject.classification	Crystallography	en
dc.subject.other	ELECTRODEPOSITS	en
dc.title	Influence of the thickness of a NixOy, support on the reflected wavelength from cholesteric liquid crystals	en
heal.type	journalArticle	en
heal.language	English	en
heal.publicationDate	1997	en
heal.abstract	In previous work [1-4] we found, for the first time, that the selectively reflected light band from cholesteric liquid crystals depends on the physical sorption properties of their supports, and we now use them to differentiate nickel electrodeposits with different grained texture and NixOy with various thicknesses. The different nickel oxide thicknesses were prepared by dipping the nickel electrodeposit samples into H2O2 solution for different time intervals. The selectively reflected light measurements from using the above samples were compared to each other, as well as to those from samples not dipped in H2O2 solution. All the experimental results were correlated with the properties of the deposits, as well as with the results derived from SEM. It is concluded that cholesteric liquid crystals can provide an efficient technique to identify surfaces with different grained texture and thickness of formed oxide.	en
heal.publisher	TAYLOR & FRANCIS LTD	en
heal.journalName	Liquid Crystals	en
dc.identifier.isi	ISI:A1997WW37100008	en
dc.identifier.volume	22	en
dc.identifier.issue	5	en
dc.identifier.spage	567	en
dc.identifier.epage	574	en