XRD and micro Raman characterization of epitaxial Bi-2201, Bi-2212 and Bi-2223 thin films

Holiastou, M; Poulakis, N; Palles, D; Liarokapis, E; Niarchos, D; Frey, U; Adrian, H

dc.contributor.author	Holiastou, M	en
dc.contributor.author	Poulakis, N	en
dc.contributor.author	Palles, D	en
dc.contributor.author	Liarokapis, E	en
dc.contributor.author	Niarchos, D	en
dc.contributor.author	Frey, U	en
dc.contributor.author	Adrian, H	en
dc.date.accessioned	2014-03-01T01:13:30Z
dc.date.available	2014-03-01T01:13:30Z
dc.date.issued	1997	en
dc.identifier.issn	0921-4534	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/12521
dc.subject	Raman Spectra	en
dc.subject	Single Crystal	en
dc.subject	Thin Film	en
dc.subject	X Rays	en
dc.subject.classification	Physics, Applied	en
dc.subject.other	Bismuth compounds	en
dc.subject.other	Epitaxial growth	en
dc.subject.other	High temperature superconductors	en
dc.subject.other	Oxide superconductors	en
dc.subject.other	Polarization	en
dc.subject.other	Raman spectroscopy	en
dc.subject.other	Single crystals	en
dc.subject.other	Sputtering	en
dc.subject.other	X ray crystallography	en
dc.subject.other	Bismuth strontium calcium copper oxide	en
dc.subject.other	Micro Raman spectroscopy	en
dc.subject.other	Superconducting films	en
dc.title	XRD and micro Raman characterization of epitaxial Bi-2201, Bi-2212 and Bi-2223 thin films	en
heal.type	journalArticle	en
heal.identifier.primary	10.1016/S0921-4534(97)00386-9	en
heal.identifier.secondary	http://dx.doi.org/10.1016/S0921-4534(97)00386-9	en
heal.language	English	en
heal.publicationDate	1997	en
heal.abstract	Micro Raman characterization is performed on high quality thin films of Bi2Sr2CuO6+x (2201), Bi2Sr2CaCu2O8+x (2212), Bi2Sr2Ca2Cu3O10+x (2223) made by dc-sputtering. Single crystal x-ray measurements reveal the full epitaxy of the films, which allows for polarized Raman spectra to be obtained.	en
heal.publisher	ELSEVIER SCIENCE BV	en
heal.journalName	Physica C: Superconductivity and its Applications	en
dc.identifier.doi	10.1016/S0921-4534(97)00386-9	en
dc.identifier.isi	ISI:A1997XZ90500073	en
dc.identifier.volume	282-287	en
dc.identifier.issue	PART 2	en
dc.identifier.spage	583	en
dc.identifier.epage	584	en