Laser plasma x-ray contact microscopy of living specimens using a chemically amplified epoxy resist

Cefalas, AC; Argitis, P; Kollia, Z; Sarantopoulou, E; Ford, TW; Stead, AD; Marranca, A; Danson, CN; Knott, J; Neely, D

dc.contributor.author	Cefalas, AC	en
dc.contributor.author	Argitis, P	en
dc.contributor.author	Kollia, Z	en
dc.contributor.author	Sarantopoulou, E	en
dc.contributor.author	Ford, TW	en
dc.contributor.author	Stead, AD	en
dc.contributor.author	Marranca, A	en
dc.contributor.author	Danson, CN	en
dc.contributor.author	Knott, J	en
dc.contributor.author	Neely, D	en
dc.date.accessioned	2014-03-01T01:13:52Z
dc.date.available	2014-03-01T01:13:52Z
dc.date.issued	1998	en
dc.identifier.issn	0003-6951	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/12756
dc.subject.classification	Physics, Applied	en
dc.subject.other	HIGH-RESOLUTION	en
dc.title	Laser plasma x-ray contact microscopy of living specimens using a chemically amplified epoxy resist	en
heal.type	journalArticle	en
heal.identifier.primary	10.1063/1.121616	en
heal.identifier.secondary	http://dx.doi.org/10.1063/1.121616	en
heal.language	English	en
heal.publicationDate	1998	en
heal.abstract	We report on the use of an epoxy based chemically amplified resist, to produce x-ray images of living biological specimens, exposed with laser plasma generated soft x rays, in the water window (2.3-4.4 nm). The photoresist response was at least two orders of magnitude "faster" than polymethyl methacrylate, the standard resist used so far in soft x-ray contact microscopy. Atomic force and scanning electron microscopy of the biological specimen images, recorded in the resist, clearly showed the flagella of the motile green alga, chlamydomonas, suggesting a lateral resolution better than 150 nm. The resist was also capable of providing height features, as small as 20 nm, in atomic force microscope depth profiles and discriminating the flagella intersection areas. (C) 1998 American Institute of Physics. [S0003-6951(98)00225-3].	en
heal.publisher	AMER INST PHYSICS	en
heal.journalName	Applied Physics Letters	en
dc.identifier.doi	10.1063/1.121616	en
dc.identifier.isi	ISI:000075274400006	en
dc.identifier.volume	72	en
dc.identifier.issue	25	en
dc.identifier.spage	3258	en
dc.identifier.epage	3260	en