Optimization of the Electrophoretic Deposition of YBa2Cu3O7-x Superconducting Large Area Coatings

Ochsenkuhn-Petropulu, M; Tarantilis, P; Tsarouchis, J; Ochsenkuhn, K; Parissakis, G

dc.contributor.author	Ochsenkuhn-Petropulu, M	en
dc.contributor.author	Tarantilis, P	en
dc.contributor.author	Tsarouchis, J	en
dc.contributor.author	Ochsenkuhn, K	en
dc.contributor.author	Parissakis, G	en
dc.date.accessioned	2014-03-01T01:13:59Z
dc.date.available	2014-03-01T01:13:59Z
dc.date.issued	1998	en
dc.identifier.issn	0026-3672	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/12823
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-0343668162&partnerID=40&md5=cedfb66ddc7b0ae1f9812915c41c04a5	en
dc.subject	Electrophoretic deposition	en
dc.subject	Large area coatings	en
dc.subject	Magnetic susceptibility	en
dc.subject	Raman spectroscopy	en
dc.subject	YBa2Cu3O7-high temperature superconductor	en
dc.subject.classification	Chemistry, Analytical	en
dc.subject.other	YBCO THIN-FILMS	en
dc.subject.other	TEMPERATURE	en
dc.title	Optimization of the Electrophoretic Deposition of YBa2Cu3O7-x Superconducting Large Area Coatings	en
heal.type	journalArticle	en
heal.language	English	en
heal.publicationDate	1998	en
heal.abstract	Large area coatings (>10 cm(2)) of the high temperature superconductor YBa2Cu3O7-x (x = 0.1 - 0.2) (YBCO) have been prepared by scale up an electrophoretic deposition technique using silver sheets and Si-wafers coated with Ag or Au as substrates. Several parameters, like the kind of the solvent, the applied voltage, the distance between the electrodes, the initial concentration of the suspension and the temperature during the electrophoresis were investigated in order to attain high deposition rates, as well as uniform YBCO coatings with the proper stoichiometry. To obtain a strongly adherent and dense coating a subsequent appropriate sintering and annealing procedure has been developed. The coatings obtained were characterized for their stoichiometry and superconducting properties by X-ray diffraction (XRD), Raman spectroscopy and magnetic measurements. The homogeneity and thickness of the films and the average grain size of the deposited particles have been investigated by optical and scanning electron microscopy (SEM).	en
heal.publisher	SPRINGER-VERLAG WIEN	en
heal.journalName	Mikrochimica Acta	en
dc.identifier.isi	ISI:000074450400010	en
dc.identifier.volume	129	en
dc.identifier.issue	3--4	en
dc.identifier.spage	233	en
dc.identifier.epage	238	en