A method for the statistical evaluation of crosstalk effect between three parallel conductors

Trakadas, PT; Capsalis, CN

dc.contributor.author	Trakadas, PT	en
dc.contributor.author	Capsalis, CN	en
dc.date.accessioned	2014-03-01T01:14:19Z
dc.date.available	2014-03-01T01:14:19Z
dc.date.issued	1999	en
dc.identifier.issn	08827516	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/12994
dc.subject	Crosstalk	en
dc.subject	MTL method	en
dc.subject	Statistical model	en
dc.subject.other	Computer simulation	en
dc.subject.other	Crosstalk	en
dc.subject.other	Electric conductors	en
dc.subject.other	Mathematical models	en
dc.subject.other	Probability	en
dc.subject.other	Statistical methods	en
dc.subject.other	Mutual inductance	en
dc.subject.other	Statistical distribution	en
dc.subject.other	Electric lines	en
dc.title	A method for the statistical evaluation of crosstalk effect between three parallel conductors	en
heal.type	journalArticle	en
heal.identifier.primary	10.1155/1999/65759	en
heal.identifier.secondary	http://dx.doi.org/10.1155/1999/65759	en
heal.publicationDate	1999	en
heal.abstract	There are several cases at which, in order to evaluate the crosstalk effect among transmission lines carrying useful signals, there is a need for probabilistic approach. This paper considers the problem of crosstalk estimation between transmission lines consisting of three conductors in a homogeneous surrounding medium, where the distance between the conductors is a random variable described by uniform distribution. The transmission lines are considered as electrically short. A closed-form equation is developed for the statistical distribution of the per-unit-length mutual inductance (Im) and an analytical one is described for the evaluation of the per-unit-length capacitance (cm). Theoretical results are compared with simulated ones for validation purposes. © 1999 OPA (Overseas Publishers Association) N.V. Published by license under the Gordon and Breach Science Publishers imprint.	en
heal.journalName	Active and Passive Electronic Components	en
dc.identifier.doi	10.1155/1999/65759	en
dc.identifier.volume	22	en
dc.identifier.issue	2	en
dc.identifier.spage	111	en
dc.identifier.epage	119	en