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Statistical modeling of RMS-delay spread under multipath fading conditions in local areas

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dc.contributor.author Dimitrakopoulos, GA en
dc.contributor.author Cadsalis, CN en
dc.date.accessioned 2014-03-01T01:15:53Z
dc.date.available 2014-03-01T01:15:53Z
dc.date.issued 2000 en
dc.identifier.issn 0018-9545 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/13806
dc.subject delay effects en
dc.subject multipath channels en
dc.subject pulse measurements en
dc.subject Rayleigh channels en
dc.subject time domain measurements en
dc.subject.classification Engineering, Electrical & Electronic en
dc.subject.classification Telecommunications en
dc.subject.classification Transportation Science & Technology en
dc.title Statistical modeling of RMS-delay spread under multipath fading conditions in local areas en
heal.type journalArticle en
heal.identifier.primary 10.1109/25.892535 en
heal.identifier.secondary http://dx.doi.org/10.1109/25.892535 en
heal.language English en
heal.publicationDate 2000 en
heal.abstract Two statistical models for the parameter of local root mean square (rms) delay spread taking into account multipath fading characteristics of the received paths' amplitudes are presented. The models have been developed under the assumption that only two "paths" exist in the radio channel. A rather specialized definition for the term "path" is used, which is explained in the introduction. The aim is the description of rms delay spread when the transceiver moves in a local area and experiences multipath fading. For this reason, the amplitudes of the two paths have been assumed to follow both the Rayleigh distribution at the first model and the Rayleigh and Rice distributions, respectively, at the second model. The time difference between the arrival of the two paths has been assumed to follow the uniform distribution for both models. In order to examine the validity of the models, measurements have been conducted and experimental results have been compared with the theoretical ones. Moreover, measurements from the literature have been obtained for additional confirmation of the models. en
heal.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC en
heal.journalName IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY en
dc.identifier.doi 10.1109/25.892535 en
dc.identifier.isi ISI:000166258100004 en
dc.identifier.volume 49 en
dc.identifier.issue 5 en
dc.identifier.spage 1522 en
dc.identifier.epage 1528 en


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