Two-dimensional dielectric profile reconstruction based on spectral-domain moment method and nonlinear optimization

Maniatis, TA; Nikita, KS; Uzunoglu, NK

dc.contributor.author	Maniatis, TA	en
dc.contributor.author	Nikita, KS	en
dc.contributor.author	Uzunoglu, NK	en
dc.date.accessioned	2014-03-01T01:15:57Z
dc.date.available	2014-03-01T01:15:57Z
dc.date.issued	2000	en
dc.identifier.issn	0018-9480	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/13846
dc.subject	biomedical imaging	en
dc.subject	electromagnetic scattering inverse problems	en
dc.subject	optimization methods	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.other	INHOMOGENEOUS BIOLOGICAL BODIES	en
dc.subject.other	DIFFRACTION TOMOGRAPHY	en
dc.subject.other	MICROWAVE TOMOGRAPHY	en
dc.subject.other	INVERSE SCATTERING	en
dc.subject.other	NUMERICAL-METHOD	en
dc.subject.other	ALGORITHMS	en
dc.subject.other	EQUATION	en
dc.subject.other	OBJECTS	en
dc.subject.other	SYSTEM	en
dc.title	Two-dimensional dielectric profile reconstruction based on spectral-domain moment method and nonlinear optimization	en
heal.type	journalArticle	en
heal.identifier.primary	10.1109/22.883860	en
heal.identifier.secondary	http://dx.doi.org/10.1109/22.883860	en
heal.language	English	en
heal.publicationDate	2000	en
heal.abstract	A novel method for two-dimensional (2-D) profile reconstruction of dielectric objects, based on nonlinear optimization, is presented in this paper, The unknown dielectric profile is expressed in terms of Gaussian basis functions. The scattering integral equation (SIE) is discretized using a spectral-domain moment technique, where the unknown internal field is described as a superposition of a limited number of plane waves, resulting in a significant reduction of the associated computational cost, The inverse-scattering problem is solved by minimizing a cost function consisting of two terms: the first term represents the error between measured and predicted values of the scattered field, while the second term corresponds to the error in satisfying the SIE for the field in the interior of the scatterer, Accurate and efficient dielectric profile reconstructions of 2-D lossy scatterers of circular and square cross sections using synthetic scattered field data are presented, while the effect of various discretization parameters on the convergence of the method is studied in detail.	en
heal.publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC	en
heal.journalName	IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES	en
dc.identifier.doi	10.1109/22.883860	en
dc.identifier.isi	ISI:000165390300007	en
dc.identifier.volume	48	en
dc.identifier.issue	11	en
dc.identifier.spage	1831	en
dc.identifier.epage	1840	en