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Effects of magnetism on the electronic structure and pairing mechanism in oxide superconductors

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dc.contributor.author Gavrichkov, VA en
dc.contributor.author Kuz'min, EV en
dc.contributor.author Ovchinnikov, SG en
dc.contributor.author Mamalis, AG en
dc.date.accessioned 2014-03-01T01:16:31Z
dc.date.available 2014-03-01T01:16:31Z
dc.date.issued 2001 en
dc.identifier.issn 1383-5416 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/14067
dc.relation.uri http://www.scopus.com/inward/record.url?eid=2-s2.0-0035789340&partnerID=40&md5=b5d9e7fcb7f4867bc54e0b746c11b001 en
dc.relation.uri http://www.scopus.com/inward/record.url?eid=2-s2.0-0035789340&partnerID=40&md5=b5d9e7fcb7f4867bc54e0b746c11b001 en
dc.subject.classification Engineering, Electrical & Electronic en
dc.subject.classification Mechanics en
dc.subject.classification Physics, Applied en
dc.subject.other Antiferromagnetic materials en
dc.subject.other Charge transfer devices en
dc.subject.other Crystal symmetry en
dc.subject.other Electric insulators en
dc.subject.other Electronic structure en
dc.subject.other Hamiltonians en
dc.subject.other Mathematical models en
dc.subject.other Oxide superconductors en
dc.subject.other Paramagnetic materials en
dc.subject.other Charge transfer antiferromagnetic insulator en
dc.subject.other Paramagnetic metal en
dc.subject.other Magnetism en
dc.title Effects of magnetism on the electronic structure and pairing mechanism in oxide superconductors en
heal.type journalArticle en
heal.language English en
heal.publicationDate 2001 en
heal.abstract Generalized tight-binding method is developed to strongly correlated electron systems. Evolution of the band structure of CuO2 layer with hole doping from the undoped charge transfer antiferromagnetic insulator to the optimally doped paramagnetic metal is obtained. Effective low energy Hamiltonian is given by a t-J-I model that allows to compared magnetic mechanism and symmetry of pairing in cuprates and ruthenates on equal footing. en
heal.publisher IOS PRESS en
heal.journalName International Journal of Applied Electromagnetics and Mechanics en
dc.identifier.isi ISI:000182517400052 en
dc.identifier.volume 13 en
dc.identifier.issue 1-4 SPEC. en
dc.identifier.spage 343 en
dc.identifier.epage 348 en


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