Statistical Analysis of an Arbitrarily Oriented Two-Wire Transmission Line Embedded in a Dissipative Layer

Papakanellos, PJ; Trakadas, PT; Capsalis, CN

dc.contributor.author	Papakanellos, PJ	en
dc.contributor.author	Trakadas, PT	en
dc.contributor.author	Capsalis, CN	en
dc.date.accessioned	2014-03-01T01:17:08Z
dc.date.available	2014-03-01T01:17:08Z
dc.date.issued	2001	en
dc.identifier.issn	0272-6343	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/14370
dc.subject	Electromagnetic interference	en
dc.subject	Induced voltages	en
dc.subject	Probabilistic analysis	en
dc.subject	Two-wire transmission line	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.title	Statistical Analysis of an Arbitrarily Oriented Two-Wire Transmission Line Embedded in a Dissipative Layer	en
heal.type	journalArticle	en
heal.identifier.primary	10.1080/027263401300364964	en
heal.identifier.secondary	http://dx.doi.org/10.1080/027263401300364964	en
heal.language	English	en
heal.publicationDate	2001	en
heal.abstract	In this paper, the response of an arbitrarily oriented two-wire transmission line (TL) excited by an electromagnetic (EM) field is examined. The TL is located inside a dissipative medium, which constitutes an infinite half-space, and the incident EM field is assumed to be a plane wave that is obliquely incidental to the interface between the lossy material about the TL and the fi-ee space. The response of the TL is investigated in terms of the induced voltages and currents at the TL termination loads, which are given in closed-form expressions. Moreover, a simple and general statistical description of the excitation EM field is introduced, based on an analysis of a typical fading propagation channel, in order to examine the statistical behavior of the induced terminal voltages in manmade environments, where a large amount of data is required for a complete deterministic description. The statistical description of the induced voltages, presented in this work, is utilizable in two directions. First, the moments of the magnitude of the terminal voltages are easily computable using simple numerical integration techniques, and second, the statistical distributions of the induced voltages are readily derivable by numerical simulation. Finally, numerical computations concerning the expected values of the induced voltages, as well as the statistical distributions of the magnitude of the induced voltages, are presented and a few concluding remarks are outlined.	en
heal.publisher	TAYLOR & FRANCIS LTD	en
heal.journalName	Electromagnetics	en
dc.identifier.doi	10.1080/027263401300364964	en
dc.identifier.isi	ISI:000170213000002	en
dc.identifier.volume	21	en
dc.identifier.issue	5	en
dc.identifier.spage	381	en
dc.identifier.epage	400	en