Statistical Analysis of an Arbitrarily Oriented Two-Wire Transmission Line Embedded in a Dissipative Layer

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dc.contributor.author Papakanellos, PJ en
dc.contributor.author Trakadas, PT en
dc.contributor.author Capsalis, CN en
dc.date.accessioned 2014-03-01T01:17:08Z
dc.date.available 2014-03-01T01:17:08Z
dc.date.issued 2001 en
dc.identifier.issn 0272-6343 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/14370
dc.subject Electromagnetic interference en
dc.subject Induced voltages en
dc.subject Probabilistic analysis en
dc.subject Two-wire transmission line en
dc.subject.classification Engineering, Electrical & Electronic en
dc.title Statistical Analysis of an Arbitrarily Oriented Two-Wire Transmission Line Embedded in a Dissipative Layer en
heal.type journalArticle en
heal.identifier.primary 10.1080/027263401300364964 en
heal.identifier.secondary http://dx.doi.org/10.1080/027263401300364964 en
heal.language English en
heal.publicationDate 2001 en
heal.abstract In this paper, the response of an arbitrarily oriented two-wire transmission line (TL) excited by an electromagnetic (EM) field is examined. The TL is located inside a dissipative medium, which constitutes an infinite half-space, and the incident EM field is assumed to be a plane wave that is obliquely incidental to the interface between the lossy material about the TL and the fi-ee space. The response of the TL is investigated in terms of the induced voltages and currents at the TL termination loads, which are given in closed-form expressions. Moreover, a simple and general statistical description of the excitation EM field is introduced, based on an analysis of a typical fading propagation channel, in order to examine the statistical behavior of the induced terminal voltages in manmade environments, where a large amount of data is required for a complete deterministic description. The statistical description of the induced voltages, presented in this work, is utilizable in two directions. First, the moments of the magnitude of the terminal voltages are easily computable using simple numerical integration techniques, and second, the statistical distributions of the induced voltages are readily derivable by numerical simulation. Finally, numerical computations concerning the expected values of the induced voltages, as well as the statistical distributions of the magnitude of the induced voltages, are presented and a few concluding remarks are outlined. en
heal.publisher TAYLOR & FRANCIS LTD en
heal.journalName Electromagnetics en
dc.identifier.doi 10.1080/027263401300364964 en
dc.identifier.isi ISI:000170213000002 en
dc.identifier.volume 21 en
dc.identifier.issue 5 en
dc.identifier.spage 381 en
dc.identifier.epage 400 en

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