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A novel micro-Fluxgate sensor based on the AMR effect of ferromagnetic film-resistors

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dc.contributor.author Dimitropoulos, PD en
dc.contributor.author Avaritsiotis, JN en
dc.contributor.author Hristoforou, E en
dc.date.accessioned 2014-03-01T01:18:33Z
dc.date.available 2014-03-01T01:18:33Z
dc.date.issued 2003 en
dc.identifier.issn 0924-4247 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/15080
dc.subject AMR sensors en
dc.subject Fluxgates en
dc.subject Magnetometers en
dc.subject MEMS en
dc.subject Spin-valves en
dc.subject.classification Engineering, Electrical & Electronic en
dc.subject.classification Instruments & Instrumentation en
dc.subject.other Ferromagnetic materials en
dc.subject.other Magnetic anisotropy en
dc.subject.other Magnetic films en
dc.subject.other Magnetic flux en
dc.subject.other Magnetometers en
dc.subject.other Magnetoresistance en
dc.subject.other Mathematical models en
dc.subject.other Spin-valves en
dc.subject.other Microscopes en
dc.title A novel micro-Fluxgate sensor based on the AMR effect of ferromagnetic film-resistors en
heal.type journalArticle en
heal.identifier.primary 10.1016/S0924-4247(03)00378-9 en
heal.identifier.secondary http://dx.doi.org/10.1016/S0924-4247(03)00378-9 en
heal.language English en
heal.publicationDate 2003 en
heal.abstract A novel magnetic field sensor is presented in this paper. It combines the classical Fluxgate principle with the anisotropic magneto-resistance (AMR) effect exhibited by barber-pole biased AMR film-resistors. It is shown that such film-resistors can be used as Fluxgate magnetic cores, because they exhibit one high-resistivity state and one low-resistivity state depending on the film magnetization polarity. Periodical alteration of the magnetization polarity, forced by an excitation field, makes the film-resistivity become a rectangular function of time, whose duty-cycle is proportional to the measured ambient field intensity. The proposed design helps with the suppression of repeatability and time-drift errors that are common in AMR sensors; the excitation field enhances the spin-alignment along the easy-axis of the film-resistor. The design also provides excellent temperature stability. Moreover, it is shown how a single AMR film-resistor can be employed for simultaneous sensing of two field components (i.e. on a x-y plane); the first component modulates the duty-cycle of the rectangular function (Fluxgate principle) and the latter its amplitude (conventional AMR effect). A complete mathematical modeling of the proposed sensor is presented in this work. The theoretical results have been verified by the use of a Honeywell HMC1021 single-chip sensor. The calibration data fairly agrees with the theory. (C) 2003 Elsevier B.V. All rights reserved. en
heal.publisher ELSEVIER SCIENCE SA en
heal.journalName Sensors and Actuators, A: Physical en
dc.identifier.doi 10.1016/S0924-4247(03)00378-9 en
dc.identifier.isi ISI:000186376400005 en
dc.identifier.volume 107 en
dc.identifier.issue 3 en
dc.identifier.spage 238 en
dc.identifier.epage 247 en


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