Optical nanowriting on azobenzene side-chain polymethacrylate thin films by near-field scanning optical microscopy

Likodimos, V; Labardi, M; Pardi, L; Allegrini, M; Giordano, M; Arena, A; Patane, S

dc.contributor.author	Likodimos, V	en
dc.contributor.author	Labardi, M	en
dc.contributor.author	Pardi, L	en
dc.contributor.author	Allegrini, M	en
dc.contributor.author	Giordano, M	en
dc.contributor.author	Arena, A	en
dc.contributor.author	Patane, S	en
dc.date.accessioned	2014-03-01T01:19:24Z
dc.date.available	2014-03-01T01:19:24Z
dc.date.issued	2003	en
dc.identifier.issn	0003-6951	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/15463
dc.subject.classification	Physics, Applied	en
dc.subject.other	Acrylics	en
dc.subject.other	Benzene	en
dc.subject.other	Birefringence	en
dc.subject.other	Copolymers	en
dc.subject.other	Isomerization	en
dc.subject.other	Light polarization	en
dc.subject.other	Near field scanning optical microscopy	en
dc.subject.other	Optical data storage	en
dc.subject.other	Optical nanowriting	en
dc.subject.other	Thin films	en
dc.title	Optical nanowriting on azobenzene side-chain polymethacrylate thin films by near-field scanning optical microscopy	en
heal.type	journalArticle	en
heal.identifier.primary	10.1063/1.1572538	en
heal.identifier.secondary	http://dx.doi.org/10.1063/1.1572538	en
heal.language	English	en
heal.publicationDate	2003	en
heal.abstract	Optical writing and subsequent reading of information on thin films of azobenzene side-chain polymethacrylates on the 100-nm scale are demonstrated by near-field scanning optical microscopy (NSOM) with polarization control. Polarized blue light at 488 nm coupled to the NSOM aperture probe activates trans-cis-trans isomerization cycles of the side chains, causing their alignment and thus locally inducing optical birefringence. Red light at 690 nm with modulated polarization is coupled to the same aperture and used to detect optical anisotropy on the local scale. Lines of width on the 100-nm scale were optically inscribed and detected even with no concurrent topographic modification. (C) 2003 American Institute of Physics.	en
heal.publisher	AMER INST PHYSICS	en
heal.journalName	Applied Physics Letters	en
dc.identifier.doi	10.1063/1.1572538	en
dc.identifier.isi	ISI:000182717900057	en
dc.identifier.volume	82	en
dc.identifier.issue	19	en
dc.identifier.spage	3313	en
dc.identifier.epage	3315	en