Electromagnetic forming - A coupled numerical electromagnetic-mechanical-electrical approach compared to measurements

Giannoglou, A; Kladas, A; Tegopoulos, J; Koumoutsos, A; Manolakos, D; Mamalis, A

dc.contributor.author	Giannoglou, A	en
dc.contributor.author	Kladas, A	en
dc.contributor.author	Tegopoulos, J	en
dc.contributor.author	Koumoutsos, A	en
dc.contributor.author	Manolakos, D	en
dc.contributor.author	Mamalis, A	en
dc.date.accessioned	2014-03-01T01:20:22Z
dc.date.available	2014-03-01T01:20:22Z
dc.date.issued	2004	en
dc.identifier.issn	0332-1649	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/15899
dc.subject	electromagnetic fields	en
dc.subject	finite element analysis	en
dc.subject	manufacturing systems	en
dc.subject	numerical analysis	en
dc.subject.classification	Computer Science, Interdisciplinary Applications	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.classification	Mathematics, Applied	en
dc.title	Electromagnetic forming - A coupled numerical electromagnetic-mechanical-electrical approach compared to measurements	en
heal.type	journalArticle	en
heal.identifier.primary	10.1108/03321640410540737	en
heal.identifier.secondary	http://dx.doi.org/10.1108/03321640410540737	en
heal.language	English	en
heal.publicationDate	2004	en
heal.abstract	Undertakes an analysis of electromagnetic forming process. Despite the fact that it is an old process, it is able to treat current problems of advanced manufacturing technology. Primary emphasis is placed on presentation of the physical phenomena, which govern the process, as well as their numerical representation by means of simplified electrical equivalent circuits and fully coupled fields approach of the electromagnetic-mechanical-electric phenomena involved. Compares the numerical results with measurements. Finally, draws conclusions and perspectives for future work.	en
heal.publisher	EMERALD GROUP PUBLISHING LIMITED	en
heal.journalName	COMPEL-THE INTERNATIONAL JOURNAL FOR COMPUTATION AND MATHEMATICS IN ELECTRICAL AND ELECTRONIC ENGINEERING	en
dc.identifier.doi	10.1108/03321640410540737	en
dc.identifier.isi	ISI:000223260400025	en
dc.identifier.volume	23	en
dc.identifier.issue	3	en
dc.identifier.spage	789	en
dc.identifier.epage	799	en