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Micro-Raman study of orientation effects of CuxSe-crystallites on Cu-rich CuGaSe2 thin films

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dc.contributor.author Xue, C en
dc.contributor.author Papadimitriou, D en
dc.contributor.author Raptis, YS en
dc.contributor.author Richter, W en
dc.contributor.author Esser, N en
dc.contributor.author Siebentritt, S en
dc.contributor.author Lux-Steiner, MCh en
dc.date.accessioned 2014-03-01T01:21:02Z
dc.date.available 2014-03-01T01:21:02Z
dc.date.issued 2004 en
dc.identifier.issn 0021-8979 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/16047
dc.subject.classification Physics, Applied en
dc.subject.other Charge coupled devices en
dc.subject.other Metallorganic chemical vapor deposition en
dc.subject.other Microstructure en
dc.subject.other Phase diagrams en
dc.subject.other Photoluminescence en
dc.subject.other Polarization en
dc.subject.other Raman spectroscopy en
dc.subject.other Scanning electron microscopy en
dc.subject.other Semiconductor materials en
dc.subject.other Solar cells en
dc.subject.other Thin films en
dc.subject.other X ray diffraction en
dc.subject.other Energy conversion efficiencies en
dc.subject.other Full width at half maximum (FWHM) en
dc.subject.other Raman bands en
dc.subject.other Copper compounds en
dc.title Micro-Raman study of orientation effects of CuxSe-crystallites on Cu-rich CuGaSe2 thin films en
heal.type journalArticle en
heal.identifier.primary 10.1063/1.1772885 en
heal.identifier.secondary http://dx.doi.org/10.1063/1.1772885 en
heal.language English en
heal.publicationDate 2004 en
heal.abstract The structural properties of copper selenide (CuxSe), formed as a secondary phase on the surface of CuGaSe2 films grown under Cu-rich conditions on GaAs (100) substrates, were studied by micro-Raman spectroscopy. Raman bands at 45 and 263 cm(-1), observed on crystallites dispersed on the CuGaSe2 film, are in agreement with the Raman modes of CuSe and Cu2Se. Polarization- and angular-dependent micro-Raman measurements reveal that the CuxSe-crystallites are grown with a preferential orientation on the CuGaSe2 surface. (C) 2004 American Institute of Physics. en
heal.publisher AMER INST PHYSICS en
heal.journalName Journal of Applied Physics en
dc.identifier.doi 10.1063/1.1772885 en
dc.identifier.isi ISI:000223055100028 en
dc.identifier.volume 96 en
dc.identifier.issue 4 en
dc.identifier.spage 1963 en
dc.identifier.epage 1966 en


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