Nonlinear viscoelastic model for the prediction of double yielding in a linear low-density polyethylene film

Spathis, G; Kontou, E

dc.contributor.author	Spathis, G	en
dc.contributor.author	Kontou, E	en
dc.date.accessioned	2014-03-01T01:21:08Z
dc.date.available	2014-03-01T01:21:08Z
dc.date.issued	2004	en
dc.identifier.issn	0021-8995	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/16085
dc.subject	Polyethylene (PE)	en
dc.subject	Yielding	en
dc.subject	creep	en
dc.subject.classification	Polymer Science	en
dc.subject.other	Creep	en
dc.subject.other	Elasticity	en
dc.subject.other	Strain	en
dc.subject.other	Tensile testing	en
dc.subject.other	Viscoelasticity	en
dc.subject.other	Yield stress	en
dc.subject.other	Eyring models	en
dc.subject.other	Inelastic behavior	en
dc.subject.other	Nonlinear viscoelastic model	en
dc.subject.other	Low density polyethylenes	en
dc.subject.other	film	en
dc.subject.other	polyethylene	en
dc.subject.other	viscoelasticity	en
dc.title	Nonlinear viscoelastic model for the prediction of double yielding in a linear low-density polyethylene film	en
heal.type	journalArticle	en
heal.identifier.primary	10.1002/app.13572	en
heal.identifier.secondary	http://dx.doi.org/10.1002/app.13572	en
heal.language	English	en
heal.publicationDate	2004	en
heal.abstract	Tensile testing and tensile creep experiments for linear low-density polyethylene in a thin-film form were examined and analyzed in terms of a nonlinear viscoelastic model. The proposed model, based on two distinct thermally activated rate processes (Eyring models), was proved to describe the double-yield-point tensile behavior of the material tested. The required model parameters were evaluated from the corresponding creep-strain curves, and this revealed the relationship between the main aspects of the inelastic behavior of polymers, that is, the monotonic loading and creep response. (C) 2004 Wiley Periodicals, Inc.	en
heal.publisher	JOHN WILEY & SONS INC	en
heal.journalName	Journal of Applied Polymer Science	en
dc.identifier.doi	10.1002/app.13572	en
dc.identifier.isi	ISI:000188708500015	en
dc.identifier.volume	91	en
dc.identifier.issue	6	en
dc.identifier.spage	3519	en
dc.identifier.epage	3527	en