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P-n junction photocurrent modelling evaluation under optical and electrical excitation

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dc.contributor.author Dervos, CT en
dc.contributor.author Skafidas, PD en
dc.contributor.author Mergos, JA en
dc.contributor.author Vassiliou, P en
dc.date.accessioned 2014-03-01T01:21:14Z
dc.date.available 2014-03-01T01:21:14Z
dc.date.issued 2004 en
dc.identifier.issn 1424-8220 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/16151
dc.subject P-n junction modelling en
dc.subject Photocurrent en
dc.subject Photovoltaics en
dc.subject Semiconductor applications en
dc.subject.classification Chemistry, Analytical en
dc.subject.classification Electrochemistry en
dc.subject.classification Instruments & Instrumentation en
dc.subject.other Forward bias en
dc.subject.other p-n junction modeling en
dc.subject.other Reverse bias en
dc.subject.other Semiconductor applications en
dc.subject.other Approximation theory en
dc.subject.other Computer simulation en
dc.subject.other Current voltage characteristics en
dc.subject.other Curve fitting en
dc.subject.other Diffusion in solids en
dc.subject.other Electric resistance en
dc.subject.other Mathematical models en
dc.subject.other Photocurrents en
dc.subject.other Photovoltaic effects en
dc.subject.other Semiconductor junctions en
dc.title P-n junction photocurrent modelling evaluation under optical and electrical excitation en
heal.type journalArticle en
heal.identifier.primary 10.3390/s40500058 en
heal.identifier.secondary http://dx.doi.org/10.3390/s40500058 en
heal.language English en
heal.publicationDate 2004 en
heal.abstract Based upon the quasi-equilibrium approximation, the validity of p-n junction modelling, has been experimentally investigated under synchronous electrical and optical excitation of silicon photo-diodes. The devices had areas of 8.2 mm2 and reverse bias saturation currents of the order of 10-10 A. Their current-voltage (I-V) response was exploited experimentally both in the dark and under various illumination levels. The quoted values for the saturation current, the ideality factor, the series resistance and the reverse-bias photocurrent are investigated for the simulation of the I-V curves via the quasi-equilibrium model. In addition, the measured I-V data have been further analysed to estimate the produced photocurrent as a function of the applied bias (forward or reverse) under given illumination levels. Comparisons between the simulated curves and the experimental data allowed a detailed photocurrent modelling validation. The proposed approach could be useful towards studying other parameters of optically activated p-n junctions such as: the bias dependence of the minority carrier diffusion lengths and/or the generated rates of electron-hole pairs (EHP). © 2004 by MDPI. en
heal.publisher MOLECULAR DIVERSITY PRESERVATION INTERNATIONAL en
heal.journalName Sensors en
dc.identifier.doi 10.3390/s40500058 en
dc.identifier.isi ISI:000223681900002 en
dc.identifier.volume 4 en
dc.identifier.issue 5 en
dc.identifier.spage 58 en
dc.identifier.epage 70 en


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