dc.contributor.author |
Korres, GN |
en |
dc.contributor.author |
Katsikas, PJ |
en |
dc.contributor.author |
Contaxis, GC |
en |
dc.date.accessioned |
2014-03-01T01:21:39Z |
|
dc.date.available |
2014-03-01T01:21:39Z |
|
dc.date.issued |
2004 |
en |
dc.identifier.issn |
0885-8950 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/16299 |
|
dc.subject |
Phase-shift transformer |
en |
dc.subject |
Tap setting estimation |
en |
dc.subject |
Tap setting observability |
en |
dc.subject |
Voltage transformer |
en |
dc.subject.classification |
Engineering, Electrical & Electronic |
en |
dc.subject.other |
Algorithms |
en |
dc.subject.other |
Angle measurement |
en |
dc.subject.other |
Observability |
en |
dc.subject.other |
State estimation |
en |
dc.subject.other |
Phase shift transformer |
en |
dc.subject.other |
Tap setting estimation |
en |
dc.subject.other |
Tap setting observability |
en |
dc.subject.other |
Electric transformers |
en |
dc.title |
Transformer tap setting observability in state estimation |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1109/TPWRS.2003.821629 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1109/TPWRS.2003.821629 |
en |
heal.language |
English |
en |
heal.publicationDate |
2004 |
en |
heal.abstract |
In conventional state estimation, transformer tap settings are treated as fixed network parameters. This may reduce the accuracy of state estimation algorithm, when a tap measurement is in error or an unmeasured tap is unknown. This paper presents a numerical observability analysis algorithm for a state estimation model which treats transformer tap settings as state variables and provides for turns ratio and phase-shift angle measurements. The proposed model is transformed to a conventional node frame of reference, by introducing one fictitious bus and one fictitious branch for each transformer with tap estimation enabled. For an unobservable system, observable islands are determined and additional measurements are directly provided for placement. Test results are presented. |
en |
heal.publisher |
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
en |
heal.journalName |
IEEE Transactions on Power Systems |
en |
dc.identifier.doi |
10.1109/TPWRS.2003.821629 |
en |
dc.identifier.isi |
ISI:000221283300001 |
en |
dc.identifier.volume |
19 |
en |
dc.identifier.issue |
2 |
en |
dc.identifier.spage |
699 |
en |
dc.identifier.epage |
706 |
en |