dc.contributor.author |
Tsirekis, CD |
en |
dc.contributor.author |
Hatziargyriou, ND |
en |
dc.contributor.author |
Papadias, BC |
en |
dc.date.accessioned |
2014-03-01T01:22:01Z |
|
dc.date.available |
2014-03-01T01:22:01Z |
|
dc.date.issued |
2005 |
en |
dc.identifier.issn |
0885-8977 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/16446 |
|
dc.subject |
ATP-EMTP simulation |
en |
dc.subject |
Energization transients |
en |
dc.subject |
Shunt reactor |
en |
dc.subject |
Switching transients |
en |
dc.subject.classification |
Engineering, Electrical & Electronic |
en |
dc.subject.other |
Computer simulation |
en |
dc.subject.other |
Electric current control |
en |
dc.subject.other |
Electric power system interconnection |
en |
dc.subject.other |
Switching circuits |
en |
dc.subject.other |
Transients |
en |
dc.subject.other |
Energization transients |
en |
dc.subject.other |
Shunt reactor |
en |
dc.subject.other |
Switching transients |
en |
dc.subject.other |
Electric power systems |
en |
dc.title |
Control of shunt reactor inrush currents in the Hellenic-Interconnected Power System |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1109/TPWRD.2004.839180 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1109/TPWRD.2004.839180 |
en |
heal.language |
English |
en |
heal.publicationDate |
2005 |
en |
heal.abstract |
Transients caused by shunt reactor switching have been an important parameter in the design of the relevant equipment (reactor, circuit breaker, insulation) of the Hellenic-Interconnected Power System. Next to the well-known damaging overvoltages produced by shunt reactor de-energization, high dc components of inrush currents with low damping factor have been observed during energization, resulting in excessive electromagnetic stresses to the windings and undesired activation of zero-sequence current relays. In the present study, inrush currents produced by shunt reactor energization are analyzed and the performance of the techniques used for their limitation is investigated. © 2005 IEEE. |
en |
heal.publisher |
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
en |
heal.journalName |
IEEE Transactions on Power Delivery |
en |
dc.identifier.doi |
10.1109/TPWRD.2004.839180 |
en |
dc.identifier.isi |
ISI:000228095900030 |
en |
dc.identifier.volume |
20 |
en |
dc.identifier.issue |
2 I |
en |
dc.identifier.spage |
757 |
en |
dc.identifier.epage |
764 |
en |