Calibration of SIOM-5FW film in the range of 0.1-4 keV

Chenais-Popovics, C; Reverdin, C; Ioannou, I

dc.contributor.author	Chenais-Popovics, C	en
dc.contributor.author	Reverdin, C	en
dc.contributor.author	Ioannou, I	en
dc.date.accessioned	2014-03-01T01:23:41Z
dc.date.available	2014-03-01T01:23:41Z
dc.date.issued	2006	en
dc.identifier.issn	0034-6748	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/17088
dc.subject.classification	Instruments & Instrumentation	en
dc.subject.classification	Physics, Applied	en
dc.subject.other	Photons	en
dc.subject.other	Sensitivity analysis	en
dc.subject.other	Photon energy	en
dc.subject.other	SIOM-5FW films	en
dc.subject.other	Thin films	en
dc.title	Calibration of SIOM-5FW film in the range of 0.1-4 keV	en
heal.type	journalArticle	en
heal.identifier.primary	10.1063/1.2206987	en
heal.identifier.secondary	http://dx.doi.org/10.1063/1.2206987	en
heal.identifier.secondary	063503	en
heal.language	English	en
heal.publicationDate	2006	en
heal.abstract	The SIOM-5FW film produced for the sub-keV x-ray detection range was calibrated here in a wide energy range (0.1-4 keV). A single set of parameters valid in the whole measured energy range was determined for the calibration of the Shangai 5F (SIOM-5FW) film from a parametric fit of the data. The sensitivity of the SIOM-5FW film was measured to be four times lower than that of the Kodak DEF film at 2.5 keV photon energy. Modeling of the DEF and SIOM-5FW films provides a good comparison of their sensitivity in the 0.1-10 keV range. © 2006 American Institute of Physics.	en
heal.publisher	AMER INST PHYSICS	en
heal.journalName	Review of Scientific Instruments	en
dc.identifier.doi	10.1063/1.2206987	en
dc.identifier.isi	ISI:000238732800023	en
dc.identifier.volume	77	en
dc.identifier.issue	6	en