dc.contributor.author |
Sekioka, S |
en |
dc.contributor.author |
Lorentzou, MI |
en |
dc.contributor.author |
Philippakou, MP |
en |
dc.contributor.author |
Prousalidis, JM |
en |
dc.date.accessioned |
2014-03-01T01:23:45Z |
|
dc.date.available |
2014-03-01T01:23:45Z |
|
dc.date.issued |
2006 |
en |
dc.identifier.issn |
0885-8977 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/17134 |
|
dc.subject |
Current dependence |
en |
dc.subject |
Energy balance |
en |
dc.subject |
Grounding resistance |
en |
dc.subject |
Hysteresis effect |
en |
dc.subject |
Soil ionization |
en |
dc.subject.classification |
Engineering, Electrical & Electronic |
en |
dc.subject.other |
Current density |
en |
dc.subject.other |
Electric conductivity |
en |
dc.subject.other |
Electric resistance |
en |
dc.subject.other |
Grounding electrodes |
en |
dc.subject.other |
Ionization of solids |
en |
dc.subject.other |
Mathematical models |
en |
dc.subject.other |
Soils |
en |
dc.subject.other |
Energy balance |
en |
dc.subject.other |
Grounding resistance model |
en |
dc.subject.other |
Hysteresis effect |
en |
dc.subject.other |
Soil ionization |
en |
dc.subject.other |
Electric grounding |
en |
dc.title |
Current-dependent grounding resistance model based on energy balance of soil ionization |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1109/TPWRD.2005.852337 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1109/TPWRD.2005.852337 |
en |
heal.language |
English |
en |
heal.publicationDate |
2006 |
en |
heal.abstract |
Soil ionization occurs around a grounding electrode when current density in the soil exceeds a critical value and reduces grounding resistance. This paper proposes a current- dependent grounding resistance model considering the soil ionization. The proposed model is derived on the basis of energy balance of the soil ionization. The resistivity of the ionization zone depends on energy stored in the zone. Analytical expressions of the model are proposed to estimate the zone resistivity. The model is verified by comparing it with experimental results. © 2006 IEEE. |
en |
heal.publisher |
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
en |
heal.journalName |
IEEE Transactions on Power Delivery |
en |
dc.identifier.doi |
10.1109/TPWRD.2005.852337 |
en |
dc.identifier.isi |
ISI:000234305200026 |
en |
dc.identifier.volume |
21 |
en |
dc.identifier.issue |
1 |
en |
dc.identifier.spage |
194 |
en |
dc.identifier.epage |
201 |
en |