Electrical characterization of molecular monolayers containing tungsten polyoxometalates

Glezos, N; Douvas, AM; Argitis, P; Saurenbach, F; Chrost, J; Livitsanos, C

dc.contributor.author	Glezos, N	en
dc.contributor.author	Douvas, AM	en
dc.contributor.author	Argitis, P	en
dc.contributor.author	Saurenbach, F	en
dc.contributor.author	Chrost, J	en
dc.contributor.author	Livitsanos, C	en
dc.date.accessioned	2014-03-01T01:24:16Z
dc.date.available	2014-03-01T01:24:16Z
dc.date.issued	2006	en
dc.identifier.issn	0167-9317	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/17200
dc.subject	Molecular electronics	en
dc.subject	Monolayers on silicon	en
dc.subject	Polyoxometalates	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.classification	Nanoscience & Nanotechnology	en
dc.subject.classification	Optics	en
dc.subject.classification	Physics, Applied	en
dc.subject.other	Electrical engineering	en
dc.subject.other	Electrodes	en
dc.subject.other	Electron transport properties	en
dc.subject.other	Electron traps	en
dc.subject.other	Molecular orientation	en
dc.subject.other	Self assembly	en
dc.subject.other	Spectroscopy	en
dc.subject.other	Tungsten	en
dc.subject.other	Charge confinement properties	en
dc.subject.other	Layer-by-layer self-assembly	en
dc.subject.other	Molecular electronics	en
dc.subject.other	Monolayers on silicon	en
dc.subject.other	Polyoxometalate-diamine multilayer films	en
dc.subject.other	Monolayers	en
dc.title	Electrical characterization of molecular monolayers containing tungsten polyoxometalates	en
heal.type	journalArticle	en
heal.identifier.primary	10.1016/j.mee.2006.01.239	en
heal.identifier.secondary	http://dx.doi.org/10.1016/j.mee.2006.01.239	en
heal.language	English	en
heal.publicationDate	2006	en
heal.abstract	Electron transport and charge confinement properties of polyoxometalate-diamine multilayer films prepared with the layer-by-layer self-assembly method have been investigated. The preparation of the multilayer film is followed by UV-Vis. spectroscopy due to the characteristic polyoxometalates (POM) spectrum. From the electrical characterization of POM multilayers the electron trapping behavior of POMs is shown. Also, the tunneling behavior of POMs is observed, if the STM probe is used as upper electrode. (c) 2006 Elsevier B.V. All rights reserved.	en
heal.publisher	ELSEVIER SCIENCE BV	en
heal.journalName	Microelectronic Engineering	en
dc.identifier.doi	10.1016/j.mee.2006.01.239	en
dc.identifier.isi	ISI:000237581900274	en
dc.identifier.volume	83	en
dc.identifier.issue	4-9 SPEC. ISS.	en
dc.identifier.spage	1757	en
dc.identifier.epage	1760	en