Multiwavelength interferometry and competing optical methods for the thermal probing of thin polymeric films

Vourdas, N; Karadimos, G; Goustouridis, D; Gogolides, E; Boudouvis, AG; Tortai, J-H; Beltsios, K; Raptis, I

dc.contributor.author	Vourdas, N	en
dc.contributor.author	Karadimos, G	en
dc.contributor.author	Goustouridis, D	en
dc.contributor.author	Gogolides, E	en
dc.contributor.author	Boudouvis, AG	en
dc.contributor.author	Tortai, J-H	en
dc.contributor.author	Beltsios, K	en
dc.contributor.author	Raptis, I	en
dc.date.accessioned	2014-03-01T01:24:41Z
dc.date.available	2014-03-01T01:24:41Z
dc.date.issued	2006	en
dc.identifier.issn	0021-8995	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/17399
dc.subject	Coefficient of thermal expansion	en
dc.subject	Glass transition	en
dc.subject	Interferometry	en
dc.subject	Lithography	en
dc.subject	Poly(methyl methacrylate)	en
dc.subject	Spectroscopic ellipsometry	en
dc.subject	Thin polymeric films	en
dc.subject.classification	Polymer Science	en
dc.subject.other	Ellipsometry	en
dc.subject.other	Glass transition	en
dc.subject.other	Interferometry	en
dc.subject.other	Lithography	en
dc.subject.other	Molecular weight	en
dc.subject.other	Plastic films	en
dc.subject.other	Coefficient of thermal expansion	en
dc.subject.other	Single-wavelength interferometry	en
dc.subject.other	Spectroscopic ellipsometry	en
dc.subject.other	Thin polymeric films	en
dc.subject.other	Thin films	en
dc.subject.other	film	en
dc.subject.other	glass transition temperature	en
dc.subject.other	molecular weight	en
dc.subject.other	optical property	en
dc.subject.other	polymethyl methacrylate	en
dc.subject.other	thermal expansion	en
dc.subject.other	thermal property	en
dc.title	Multiwavelength interferometry and competing optical methods for the thermal probing of thin polymeric films	en
heal.type	journalArticle	en
heal.identifier.primary	10.1002/app.25107	en
heal.identifier.secondary	http://dx.doi.org/10.1002/app.25107	en
heal.language	English	en
heal.publicationDate	2006	en
heal.abstract	Multiple-wavelength interferometry (MWI), a new optical method for the thermal probing of thin polymer films, is introduced and explored. MWI is compared with two standard optical methods, single-wavelength interferometry and spectroscopic ellipsometry, with regard to the detection of the glass transition temperature (T-g) of thin supported polymer films. Poly(methyl methacrylate) films are deposited by spin coating on Si and SiO2 substrates. MWI is also applied to the study of the effect of film thickness (25-600 nm) and polymer molecular weight (1.5 x 10(4) to 10(6)) on T-g, the effect of film thickness on the coefficients of thermal expansion both below and above T-g, and the effect of deep UV exposure time on the thermal properties (glass transition and degradation temperatures) of the films. This further exploration of the MWI method provides substantial insights about intricate issues pertinent to the thermal behavior of thin polymer films. (c) 2006 Wiley Periodicals, Inc.	en
heal.publisher	JOHN WILEY & SONS INC	en
heal.journalName	Journal of Applied Polymer Science	en
dc.identifier.doi	10.1002/app.25107	en
dc.identifier.isi	ISI:000241593700091	en
dc.identifier.volume	102	en
dc.identifier.issue	5	en
dc.identifier.spage	4764	en
dc.identifier.epage	4774	en