dc.contributor.author |
Pandis, Ch |
en |
dc.contributor.author |
Brilis, N |
en |
dc.contributor.author |
Tsamakis, D |
en |
dc.contributor.author |
Ali, HA |
en |
dc.contributor.author |
Krishnamoorthy, S |
en |
dc.contributor.author |
Iliadis, AA |
en |
dc.date.accessioned |
2014-03-01T01:25:06Z |
|
dc.date.available |
2014-03-01T01:25:06Z |
|
dc.date.issued |
2006 |
en |
dc.identifier.issn |
0038-1101 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/17542 |
|
dc.subject |
Hydrogen effect |
en |
dc.subject |
Native defects |
en |
dc.subject |
P-type ZnO |
en |
dc.subject |
PLD |
en |
dc.subject |
Undoped |
en |
dc.subject.classification |
Engineering, Electrical & Electronic |
en |
dc.subject.classification |
Physics, Applied |
en |
dc.subject.classification |
Physics, Condensed Matter |
en |
dc.subject.other |
Electric conductivity |
en |
dc.subject.other |
Electric properties |
en |
dc.subject.other |
Oxides |
en |
dc.subject.other |
Pressure effects |
en |
dc.subject.other |
Silicon |
en |
dc.subject.other |
Substrates |
en |
dc.subject.other |
Thermal conductivity |
en |
dc.subject.other |
Thin films |
en |
dc.subject.other |
Hydrogen effects |
en |
dc.subject.other |
Native defects |
en |
dc.subject.other |
P-type ZnO |
en |
dc.subject.other |
Undoped |
en |
dc.subject.other |
Pulsed laser deposition |
en |
dc.title |
Role of low O2 pressure and growth temperature on electrical transport of PLD grown ZnO thin films on Si substrates |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1016/j.sse.2006.04.025 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1016/j.sse.2006.04.025 |
en |
heal.language |
English |
en |
heal.publicationDate |
2006 |
en |
heal.abstract |
Undoped ZnO thin films have been grown on (100) Si substrates by pulsed laser deposition. The effect of growth parameters such as temperature, O-2 partial pressure and laser fluence on the structural and electrical properties of the films has been investigated. It is shown that the well-known native n-type conductivity, attributed to the activation of hydrogenic donor states, exhibits a conversion from n-type to p-type when the O-2 partial pressure is reduced from 10(-4) to 10(-7) Torr at growth temperatures lower than 400 degrees C. The p-type conductivity could be attributed to the dominant role of the acceptor Zn vacancies for ZnO films grown at very low O-2 pressures. (c) 2006 Elsevier Ltd. All rights reserved. |
en |
heal.publisher |
PERGAMON-ELSEVIER SCIENCE LTD |
en |
heal.journalName |
Solid-State Electronics |
en |
dc.identifier.doi |
10.1016/j.sse.2006.04.025 |
en |
dc.identifier.isi |
ISI:000239499400035 |
en |
dc.identifier.volume |
50 |
en |
dc.identifier.issue |
6 |
en |
dc.identifier.spage |
1119 |
en |
dc.identifier.epage |
1123 |
en |