Structural and electrical characterization of barium strontium titanate films prepared by sol-gel technique on brass (CuZn) substrate

Kribalis, S; Tsakiridis, PE; Dedeloudis, C; Hristoforou, E

dc.contributor.author	Kribalis, S	en
dc.contributor.author	Tsakiridis, PE	en
dc.contributor.author	Dedeloudis, C	en
dc.contributor.author	Hristoforou, E	en
dc.date.accessioned	2014-03-01T01:25:12Z
dc.date.available	2014-03-01T01:25:12Z
dc.date.issued	2006	en
dc.identifier.issn	1454-4164	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/17592
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-33748067325&partnerID=40&md5=0b8b3f90b6daa7ae5dc501842431abe4	en
dc.subject	Barium titanate	en
dc.subject	Resistivity	en
dc.subject	Sol-gel	en
dc.subject	Strontium	en
dc.subject	Thin films	en
dc.subject.classification	Materials Science, Multidisciplinary	en
dc.subject.classification	Optics	en
dc.subject.classification	Physics, Applied	en
dc.subject.other	DIELECTRIC-PROPERTIES	en
dc.subject.other	THIN-FILMS	en
dc.subject.other	PTCR CERAMICS	en
dc.subject.other	BATIO3	en
dc.subject.other	SRTIO3	en
dc.subject.other	CAPACITOR	en
dc.title	Structural and electrical characterization of barium strontium titanate films prepared by sol-gel technique on brass (CuZn) substrate	en
heal.type	journalArticle	en
heal.language	English	en
heal.publicationDate	2006	en
heal.abstract	The crystal structure, surface morphology and electrical properties of polycrystalline (Ba,Sr)TiO3 films were investigated. The barium strontium titanate (BST) films were prepared by sol-gel processing using barium acetate (Ba(CH3COO)(2)), strontium acetate (Sr(CH3COO)(2)) and titanium isopropoxide (Ti(OC3H7)(4)) as starting materials. Acetic acid and acetylacetone were selected as solvents. Six different types of gels were prepared, increasing the Sr2+ content from 0% to 50%. The films were deposited on brass (CuZn) substrate and then sintered at 750 degrees C for 2 h and annealed at 500 C for 1h. The single layer thickness of the films was about 10 pm. The surface morphology of the film was observed using a scanning electron microscope (SEM). X-ray diffraction (XRD) results show that the film exhibits a pure perovskite phase. The temperature dependence of resistance of films has been investigated and the results showed that the room-temperature resistivity decreases by increasing the Sr2+ content. In all cases the films showed a large negative temperature coefficient of resistivity, apart from the ferroelectric transition temperature where a PTCR peak response also appears. Such large temperature coefficient is attributed to the zinc and copper oxides, formed on the CuZn substrate due to its oxidation at elevated temperature, thus offering a significant temperature dependence effect for possible use in sensing applications.	en
heal.publisher	NATL INST OPTOELECTRONICS	en
heal.journalName	Journal of Optoelectronics and Advanced Materials	en
dc.identifier.isi	ISI:000239874400029	en
dc.identifier.volume	8	en
dc.identifier.issue	4	en
dc.identifier.spage	1475	en
dc.identifier.epage	1478	en