A model for dielectrics experiencing partial discharges under high electric fields

Karagiannopoulos, CG

dc.contributor.author	Karagiannopoulos, CG	en
dc.date.accessioned	2014-03-01T01:25:42Z
dc.date.available	2014-03-01T01:25:42Z
dc.date.issued	2007	en
dc.identifier.issn	0304-3886	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/17734
dc.subject	High electric fields	en
dc.subject	Insulating materials	en
dc.subject	Partial discharges	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.other	Electric fields	en
dc.subject.other	Electric insulating materials	en
dc.subject.other	Equivalent circuits	en
dc.subject.other	Inductance	en
dc.subject.other	Mathematical models	en
dc.subject.other	Partial discharges	en
dc.subject.other	Phase shift	en
dc.subject.other	Measuring circuit	en
dc.subject.other	Parasitic inductance	en
dc.subject.other	Dielectric materials	en
dc.subject.other	Dielectric materials	en
dc.subject.other	Electric fields	en
dc.subject.other	Electric insulating materials	en
dc.subject.other	Equivalent circuits	en
dc.subject.other	Inductance	en
dc.subject.other	Mathematical models	en
dc.subject.other	Partial discharges	en
dc.subject.other	Phase shift	en
dc.title	A model for dielectrics experiencing partial discharges under high electric fields	en
heal.type	journalArticle	en
heal.identifier.primary	10.1016/j.elstat.2006.08.008	en
heal.identifier.secondary	http://dx.doi.org/10.1016/j.elstat.2006.08.008	en
heal.language	English	en
heal.publicationDate	2007	en
heal.abstract	This work is in the research field of partial discharges to electrical insulating materials. A theoretical model is proposed that simulates the partial discharge's development within a metal (solid insulating material) metal structure. A nonlinear, time-dependent resistance using a new formula simulates the activity of partial discharges in dielectrics and the suggested equivalent circuit is analysed. Comparison of the experimental results and the outcome of the model demonstrates satisfactory consistency. Slight deviations consist of a minor phase shift between the computed and measured waveforms, as well as small oscillations of the waveform measured in the vicinity of the potential steps. These deviations are attributed to a very small parasitic inductance, which is always present in the measuring circuit. (c) 2007 Elsevier B.V. All rights reserved.	en
heal.publisher	ELSEVIER SCIENCE BV	en
heal.journalName	Journal of Electrostatics	en
dc.identifier.doi	10.1016/j.elstat.2006.08.008	en
dc.identifier.isi	ISI:000247588300008	en
dc.identifier.volume	65	en
dc.identifier.issue	8	en
dc.identifier.spage	535	en
dc.identifier.epage	541	en