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Behavioral modeling of power amplifiers for wireless applications

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dc.contributor.author Vryssas, KS en
dc.contributor.author Samelis, A en
dc.date.accessioned 2014-03-01T01:25:58Z
dc.date.available 2014-03-01T01:25:58Z
dc.date.issued 2007 en
dc.identifier.issn 1096-4290 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/17851
dc.subject AM-AM and AM-PM distortion en
dc.subject Behavioral models third-order intermodulation distortion (IMD3) en
dc.subject IMD3 sweet spots en
dc.subject Quadrature technique en
dc.subject RF power amplifiers (RF-PAs) en
dc.subject.classification Computer Science, Interdisciplinary Applications en
dc.subject.classification Engineering, Electrical & Electronic en
dc.subject.other Computer simulation en
dc.subject.other Mathematical models en
dc.subject.other Nonlinear systems en
dc.subject.other Thermal effects en
dc.subject.other Behavioral models third-order intermodulation distortion (IMD3) en
dc.subject.other Quadrature technique en
dc.subject.other RF power amplifiers (RF-PA) en
dc.subject.other Power amplifiers en
dc.title Behavioral modeling of power amplifiers for wireless applications en
heal.type journalArticle en
heal.identifier.primary 10.1002/mmce.20242 en
heal.identifier.secondary http://dx.doi.org/10.1002/mmce.20242 en
heal.language English en
heal.publicationDate 2007 en
heal.abstract In this paper, an improved empirical behavioral model for radio-frequency power amplifiers (RF-PAs) is presented. The model was implemented in a commercial nonlinear microwave simulator. It belongs to the category of bandpass PA models, which exhibits memory effects due to the low frequency dependence of bias and temperature. Additionally, it facilitates accurate and efficient system level simulations of RF-PA large-signal behaviors such as self-bias, AM-AM, AM-PM, gain expansion effects, and intermodulation distortion (IMD) sweet-spots. The model was validated using measurement data obtained from a commercial CDMA PA at 1.88 GHz. (c) 2007 Wiley Periodicals, Inc. en
heal.publisher JOHN WILEY & SONS INC en
heal.journalName International Journal of RF and Microwave Computer-Aided Engineering en
dc.identifier.doi 10.1002/mmce.20242 en
dc.identifier.isi ISI:000248696600005 en
dc.identifier.volume 17 en
dc.identifier.issue 5 en
dc.identifier.spage 480 en
dc.identifier.epage 492 en


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