Methodology for the optimal component selection of electronic devices under reliability and cost constraints

Zafiropoulos, EP; Dialynas, EN

dc.contributor.author	Zafiropoulos, EP	en
dc.contributor.author	Dialynas, EN	en
dc.date.accessioned	2014-03-01T01:26:40Z
dc.date.available	2014-03-01T01:26:40Z
dc.date.issued	2007	en
dc.identifier.issn	0748-8017	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/18160
dc.subject	Bayesian networks	en
dc.subject	Reliability modeling	en
dc.subject	Reliability optimization	en
dc.subject	Simulated annealing	en
dc.subject.classification	Engineering, Multidisciplinary	en
dc.subject.classification	Engineering, Industrial	en
dc.subject.classification	Operations Research & Management Science	en
dc.subject.other	Bayesian networks	en
dc.subject.other	Computational methods	en
dc.subject.other	Constraint theory	en
dc.subject.other	Costs	en
dc.subject.other	Reliability	en
dc.subject.other	Simulated annealing	en
dc.subject.other	Cost constraints	en
dc.subject.other	Reliability block diagrams	en
dc.subject.other	Reliability modeling	en
dc.subject.other	Reliability optimization	en
dc.subject.other	Electronic equipment	en
dc.title	Methodology for the optimal component selection of electronic devices under reliability and cost constraints	en
heal.type	journalArticle	en
heal.identifier.primary	10.1002/qre.850	en
heal.identifier.secondary	http://dx.doi.org/10.1002/qre.850	en
heal.language	English	en
heal.publicationDate	2007	en
heal.abstract	The objective of this paper is to present an efficient computational methodology for the reliability optimization of electronic devices under cost constraints. The system modeling for calculating the reliability indices of the electronic devices is based on Bayesian networks using the fault tree approach, in order to overcome the limitations of the series parallel topology of the reliability block diagrams. Furthermore, the Bayesian network modeling for the reliability analysis provides greater flexibility for representing multiple failure modes and dependent failure events, and simplifies fault diagnosis and reliability allocation. The optimal selection of components is obtained using the simulated annealing algorithm, which has proved to be highly efficient in complex optimization problems where gradient-based methods can not be applied. The reliability modeling and optimization methodology was implemented into a computer program in Matlab using a Bayesian network toolbox. The methodology was applied for the optimal selection of components for an electrical switch of power installations under reliability and cost constraints. The full enumeration of the solution space was calculated in order to demonstrate the efficiency of the proposed optimization algorithm. The results obtained are excellent,since a near optimum solution was found in a small fraction of the time needed for the complete enumeration (3%). All the optimum solutions found during consecutive runs of the optimization algorithm lay in the top 0.3% of the solutions that satisfy the reliability and cost constraints. Copyright (C) 2007 John Wiley & Sons, Ltd.	en
heal.publisher	JOHN WILEY & SONS LTD	en
heal.journalName	Quality and Reliability Engineering International	en
dc.identifier.doi	10.1002/qre.850	en
dc.identifier.isi	ISI:000251804600002	en
dc.identifier.volume	23	en
dc.identifier.issue	8	en
dc.identifier.spage	885	en
dc.identifier.epage	897	en