Optical properties of nanocrystalline SnS2 thin films

Panda, SK; Antonakos, A; Liarokapis, E; Bhattacharya, S; Chaudhuri, S

dc.contributor.author	Panda, SK	en
dc.contributor.author	Antonakos, A	en
dc.contributor.author	Liarokapis, E	en
dc.contributor.author	Bhattacharya, S	en
dc.contributor.author	Chaudhuri, S	en
dc.date.accessioned	2014-03-01T01:26:49Z
dc.date.available	2014-03-01T01:26:49Z
dc.date.issued	2007	en
dc.identifier.issn	0025-5408	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/18237
dc.subject	A. Nanostructures	en
dc.subject	A. Semiconductors	en
dc.subject	A. Thin films	en
dc.subject	C. Raman spectroscopy	en
dc.subject	D. Optical properties	en
dc.subject.classification	Materials Science, Multidisciplinary	en
dc.subject.other	Film preparation	en
dc.subject.other	Glass	en
dc.subject.other	Nanostructured materials	en
dc.subject.other	Optical properties	en
dc.subject.other	Quantum theory	en
dc.subject.other	Raman spectroscopy	en
dc.subject.other	Scanning electron microscopy	en
dc.subject.other	Semiconducting tin compounds	en
dc.subject.other	X ray diffraction analysis	en
dc.subject.other	Blue shifts	en
dc.subject.other	Capping agents	en
dc.subject.other	Quantum confinement	en
dc.subject.other	Thin films	en
dc.title	Optical properties of nanocrystalline SnS2 thin films	en
heal.type	journalArticle	en
heal.identifier.primary	10.1016/j.materresbull.2006.06.028	en
heal.identifier.secondary	http://dx.doi.org/10.1016/j.materresbull.2006.06.028	en
heal.language	English	en
heal.publicationDate	2007	en
heal.abstract	Thin films of nanocrystalline SnS2 on glass substrates were prepared from solution by dip coating and then sulfurized in H2S (H2S:Ar = 1: 10) atmosphere. The films had an average thickness of 60 nm and were characterized by X-ray diffraction studies, scanning electron microscopy, EDAX, transmission electron microscopy, UV-vis spectroscopy, and Raman spectroscopy. The influence of annealing temperature (150-300 degrees C) on the crystallinity and particle size was studied. The effect of CTAB as a capping agent has been tested. X-ray diffraction analysis revealed the polycrystalline nature of the films with a preferential orientation along the c-axis. Optical transmission spectra indicated a marked blue shift of the absorption edge due to quantum confinement and optical band gap was found to vary from 3.5 to 3.0 eV with annealing temperature. Raman studies indicated a prominent broad peak at similar to 314 cm(-1), which confirmed the presence of nanocrystalline SnS2 phase. (C) 2006 Elsevier Ltd. All rights reserved.	en
heal.publisher	PERGAMON-ELSEVIER SCIENCE LTD	en
heal.journalName	Materials Research Bulletin	en
dc.identifier.doi	10.1016/j.materresbull.2006.06.028	en
dc.identifier.isi	ISI:000245133500022	en
dc.identifier.volume	42	en
dc.identifier.issue	3	en
dc.identifier.spage	576	en
dc.identifier.epage	583	en