Rapid, automated measurement of layer thicknesses on steel coin blanks using laser-induced-breakdown spectroscopy depth profiling

Asimellis, G; Giannoudakos, A; Kompitsas, M

dc.contributor.author	Asimellis, G	en
dc.contributor.author	Giannoudakos, A	en
dc.contributor.author	Kompitsas, M	en
dc.date.accessioned	2014-03-01T01:26:57Z
dc.date.available	2014-03-01T01:26:57Z
dc.date.issued	2007	en
dc.identifier.issn	0003-6935	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/18311
dc.subject.classification	Optics	en
dc.subject.other	Current spectroscopic method	en
dc.subject.other	Layer thickness	en
dc.subject.other	Near real time method	en
dc.subject.other	Precalibrated coins	en
dc.subject.other	Electroplated products	en
dc.subject.other	Inductively coupled plasma	en
dc.subject.other	Laser ablation	en
dc.subject.other	Laser spectroscopy	en
dc.subject.other	Real time systems	en
dc.subject.other	Steel structures	en
dc.subject.other	Thickness measurement	en
dc.title	Rapid, automated measurement of layer thicknesses on steel coin blanks using laser-induced-breakdown spectroscopy depth profiling	en
heal.type	journalArticle	en
heal.identifier.primary	10.1364/AO.46.000935	en
heal.identifier.secondary	http://dx.doi.org/10.1364/AO.46.000935	en
heal.language	English	en
heal.publicationDate	2007	en
heal.abstract	We report application of a near-real-time method to determine layer thickness on electroplated coin blanks. The method was developed on a simple laser-induced-breakdown spectroscopy (LIBS) arrangement by monitoring relative emission-line intensities from key probe elements via successive laser ablation shots. This is a unique LIBS application where no other current spectroscopic method (inductively coupled plasma or x-ray fluorescence) can be applied effectively. Method development is discussed, and results with precalibrated coins are presented. © 2007 Optical Society of America.	en
heal.publisher	OPTICAL SOC AMER	en
heal.journalName	Applied Optics	en
dc.identifier.doi	10.1364/AO.46.000935	en
dc.identifier.isi	ISI:000244262600016	en
dc.identifier.volume	46	en
dc.identifier.issue	6	en
dc.identifier.spage	935	en
dc.identifier.epage	942	en