Evaluation of the strains in charge-ordered Pr1-xCa xMnO3 thin films using Raman spectroscopy

Antonakos, A; Palles, D; Liarokapis, E; Filippi, M; Prellier, W

dc.contributor.author	Antonakos, A	en
dc.contributor.author	Palles, D	en
dc.contributor.author	Liarokapis, E	en
dc.contributor.author	Filippi, M	en
dc.contributor.author	Prellier, W	en
dc.date.accessioned	2014-03-01T01:28:21Z
dc.date.available	2014-03-01T01:28:21Z
dc.date.issued	2008	en
dc.identifier.issn	0021-8979	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/18808
dc.subject.classification	Physics, Applied	en
dc.subject.other	COLOSSAL MAGNETORESISTANCE	en
dc.subject.other	X-RAY	en
dc.subject.other	THERMAL-EXPANSION	en
dc.subject.other	LIGHT-SCATTERING	en
dc.subject.other	UNIAXIAL-STRESS	en
dc.subject.other	LASER-BEAM	en
dc.subject.other	MANGANITES	en
dc.subject.other	RESISTIVITY	en
dc.subject.other	DEPENDENCE	en
dc.subject.other	SILICON	en
dc.title	Evaluation of the strains in charge-ordered Pr1-xCa xMnO3 thin films using Raman spectroscopy	en
heal.type	journalArticle	en
heal.identifier.primary	10.1063/1.2978207	en
heal.identifier.secondary	http://dx.doi.org/10.1063/1.2978207	en
heal.identifier.secondary	063508	en
heal.language	English	en
heal.publicationDate	2008	en
heal.abstract	Thin films of Pr1-xCaxMnO3 (x=0.5,0.6) deposited on LaAlO3 and SrTiO3 substrates have been studied by Raman spectroscopy at low temperatures in order to investigate the effect of strains from the Ca doping or the substrate. A detailed assignment of the observed bands is suggested based on the present observations and published results on manganites. We assign the low frequency bands to modes involving only displacements of the A-site ions from their mass dependence by the Ca substitution for Pr (Pr/Ca-O modes). The A(g)(2) mode, which is related to the tilting angle of the MnO6 octahedra, appears strongly coupled with the carriers and is very sensitive to the strain effects. Based on the Raman data obtained from the film cross sectional area, we extract the strain distribution across the film. Besides, we calculate in the pseudocubic approximation the phonon deformation potentials, the Gruneisen parameter, and the bulk modulus of the film, which are in. good agreement with the ultrasonic measurements. (C) 2008 American Institute of Physics. [DOI: 10.1063/1.2978207]	en
heal.publisher	AMER INST PHYSICS	en
heal.journalName	Journal of Applied Physics	en
dc.identifier.doi	10.1063/1.2978207	en
dc.identifier.isi	ISI:000260119300035	en
dc.identifier.volume	104	en
dc.identifier.issue	6	en